MIL-M-38510/291B
11/ Power down test (PWRDWN) terminal conditions shall be as follows:
a. Use timing parameters and limits specified on figure 4. b. VOL ≤ 0.45 V; VOH � 2.4 V.
c. Use load specified on figure 5.
d. VIL = 0 V; VIH = 4.5 V.
e. The power down test shall be performed as follows: (1) Power up RAM to VCC = 4.5 V.
(2) Write topologically true checkerboard pattern into RAM memory array (see Appendix A).
(3) Reduce VCC to 2.0 V. All device inputs shall be reduced along with VCC exercising special care to avoid latch-up. (See 4.5)
(4) Maintain RAM at reduced voltage for 500 ms (0.5 second) minimum. (5) Raise VCC to 4.5 V.
(6) Verify RAM contents to be unchanged from pattern written in (2) above.
(7) Repeat steps (1) through (6), except use the complement of the first checkerboard pattern
12/ ADDCOMP (Functional) test terminal conditions shall be as follows:
a. Use timing parameter and limits specified on figure 4.
b. The output voltages shall be: VOL ≤ 0.45 V; VOH � 2.4 V. c. Use ADDCOMP pattern (see Appendix A).
d. Use load specified on figure 5.
e. VCC = 4.5 V; VIL = 0.8 V; VIH = 2.3 V.
13/ Timing test terminal conditions shall be as follows:
a. Use timing parameter and limits specified on figure 4. b. VOL ≤ 0.45 V; VOH � 2.4 V.
c. Use MARCH pattern (see Appendix A).
d. Use load specified on figure 5.
e. VCC = 4.5 V; VIL = 0.8 V; VIH = 2.3 V.
14/ Operating current test (ICCOP) terminal conditions shall be as follows:
a. Use timing parameters and limits specified on figure 4.
b. Use topologically true checkerboard pattern (see Appendix A). c. Use load specified on figure 5.
d. VIL = 0.8 V; VIH = 5.5 V.
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