MIL-M-38510/291B
TABLE I. Electrical performance characteristics (device types 01 through 06 and device types 09 and 10).- Continued.
Test |
Symbol |
Conditions VSS = 0 V, VCC = 5.5 V -55°C ≤ TC ≤ +125°C unless otherwise specified |
Device types |
Limits |
Unit |
|
Min |
Max |
|||||
0utput capacitance |
C0 |
TC = +25°C, VCC = GND VIN = GND, f = 1 MHz |
01,03,04, 05,06,09,10 |
12 |
pF |
|
02 |
14 |
|||||
Read or write cycle time |
tAVAV |
VCC = 4.5 V to 5.5 V See figure 4 |
01 |
150 |
ns |
|
03 |
85 |
|||||
04 |
90 |
|||||
05 |
200 |
|||||
06 |
45 |
|||||
09 |
70 |
|||||
10 |
70 |
|||||
Address access time |
tAVQV |
01 |
150 |
ns |
||
02 |
200 |
|||||
03 |
85 |
|||||
04 |
90 |
|||||
05 |
200 |
|||||
06 |
45 |
|||||
09 |
70 |
|||||
10 |
70 |
|||||
Chip enable access time |
tELQV |
01 |
150 |
ns |
||
02 |
200 |
|||||
03 |
85 |
|||||
04 |
90 |
|||||
05 |
200 |
|||||
06 |
45 |
|||||
09 |
70 |
|||||
10 |
70 |
|||||
Chip disable to output disable time |
tEHQZ |
01,04 |
50 |
ns |
||
02 |
80 |
|||||
03 |
40 |
|||||
05 |
60 |
|||||
06 |
25 |
|||||
09 |
40 |
|||||
10 |
40 |
|||||
0utput hold after address change |
tAVQX |
01,05 |
0 |
ns |
||
06 |
3 |
|||||
03,04, 09,10 |
5 |
|||||
Chip enable to output active |
tELQX |
01,05 |
0 |
ns |
||
02 |
10 |
|||||
06 |
3 |
|||||
03,04, 09,10 |
5 |
See footnotes at end of table.
5
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