TABLE III. Group A inspection for device type 08 - Continued. 1/
Subgroup |
Symbol |
MIL- STD- 883 method |
Case R |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
17 |
18 |
19 |
20 |
Measured terminal |
Test limits |
Unit |
|
Case Z |
1 |
2 |
3 |
4 |
5 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
17 |
20 |
21 |
22 |
23 |
24 |
Min |
Max |
|||||
Test no. |
A0 |
A1 |
A2 |
A3 |
A4 |
A5 |
A6 |
DQ |
WE |
VSS |
CE |
DIN |
A7 |
A8 |
A9 |
A10 |
A11 |
A12 |
A13 |
VCC |
|||||||
9 TC=+25°C |
tAVQV |
See fig. 7 |
82 |
13/ |
13/ |
13/ |
13/ |
13/ |
13/ |
13/ |
13/ |
13/ |
GND |
13/ |
13/ |
13/ |
13/ |
13/ |
13/ |
13/ |
13/ |
13/ |
4.5 V |
DQ |
175 |
ns |
|
10 |
Same tests, terminal conditions, and limits as for subgroup 9, except TC = +125°C. |
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11 |
Same tests, terminal conditions, and limits as for subgroup 9, except TC = -55°C. |
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12 TC=+25°C |
ICCOP |
83 |
14/ |
14/ |
14/ |
14/ |
14/ |
14/ |
14/ |
14/ |
14/ |
GND |
14/ |
14/ |
14/ |
14/ |
14/ |
14/ |
14/ |
14/ |
14/ |
5.5 V |
VCC |
6 |
mA |
||
1/ Pins not designated may be "high" level logic, or "low" level logic. Exceptions are as follows: VIC (pos) tests, the VSS terminals shall be open; VIC (neg) tests, the VCC
terminal shall be open; ISS tests, the output terminal shall be open.
2/ VIL = 0.8 V, VIH = 3.0 V.
3/ Contents of addressed cell shall be = data "0", IOL = 5 mA.
4/ VIL = 0.8 V; VIH = 2.3 V.
5/ Contents of addressed cell shall be = data "1", IOH = -5 mA.
6/ The device manufacturer may, at his option, measure IIL and IIH at +25°C for each individual input or measure all inputs together.
7/ Random data pattern (data in memory established by power turn-on).
8/ All data are "1's" in memory.
9/ All data are "0's" in memory.
10/ See 4.4.1c.
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