MIL-M-38510/291B
9/ Timing waveforms shown on figure 4 shall be applied while performing a WRITE/WRITE address complement pattern
(see figure 8). This procedure ensures that the following parameters meet the specified limits:
Parameter |
Limits |
Unit |
||||
Device type 03 |
Device type 09 |
|||||
Min |
Max |
Min |
Max |
|||
tAVAV tAVQV tELQV |
85 --- --- |
--- 85 85 |
70 --- --- |
--- 70 70 |
ns " " |
|
VIL VIH |
0.0 3.0 |
0.0 3.0 |
V " |
|||
Output compare level |
VOL VOH |
1.5 1.5 |
1.5 1.5 |
" " |
||
Read cycle timing |
The output shall be loaded with the load specified on figure 5. If the test equipment limitations prevent the simultaneous application or verification of all the specified parameters, multiple executions of the algorithm may be required to effect the measurement of all dynamic parameters.
10/ When testing subgroup 9, device type 09 will have the same test conditions as device type 03, except for the following:
a. tELQV = 70 ns maximum. b. tELQV = 70 ns maximum. c. tAVQV = 70 ns maximum. d. tAVQV = 70 ns maximum.
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