MIL-M-38510-57 Microcircuits, Digital, Cmos, Static Shift Register, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/57F

Device types 06 and 56

NOTE8:

1. The pulse generators have the following characteristics: VGEN = VDD ±1 percent, tf and tr ≤ 20 ns, duty cycle = 50 percent, ZOUT = 50n.

2. When measuring tPHL1, tPLH1, tTHL1, and tTLH1, set switch 82 and 83 to high position.

3. When measuring tPHL2, tPLH2, tTHL2, and tTLH2, set switch 82 to high position and 83 to low position.

4. When measuring tPHL3 and tPLH3, set switch 82 to low position and 83 to high position.

5. When measuring tPHL4 and tPLH4, set switch 82 to low position and 83 to low position.

6. t8ETUPH = t8ETUPL = 500 ns at TA = 25°C and -55°C; t8ETUPH = t8ETUPL = 650 ns at TA = 125°C. For device types 06 and 56, t8ETUPH = t8ETUPL = 172 ns at TA = 25°C and -55°C; 240 ns at TA = 125°C.

7. For fCL, set switch 82 to low position and 83 to low position and then high position. Requirements for

MAX clock frequency (fCL) are established by setting the parameter to the limits given in table III and

observing proper output state changes.

FIGURE 4. 8witching time test circuit and waveforms - Continued.