MIL-M-38510-57 Microcircuits, Digital, Cmos, Static Shift Register, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/57F

Device type 05 and 55

NOTES:

1.  The pulse generators have the following characteristics: VGEN  = VDD  ±1 percent, tf  and tr  ≤ 20 ns, duty cycle = 50 percent, ZOUT  = 50n.

2.  When measuring tPHL1, tPHL2, tPHL3, tPLH1, tPLH2, tPLH3, tTHL1, tTHL2, tTHL3, tTLH1, tTLH2, and tTLH3, set switch S1

to low position.

3.  When measuring tPHL4  and tPLH4, set switch S2 to high position.

4.  tSETUPH = tSETUPL = 400 ns at TA  = 25°C and -55°C; tSETUPH = tSETUPL = 680 ns at TA = 125°C.  For device types 05 and 55, tSETUPH = tSETUPL = 215 ns at TA = 25°C and -55°C; 300 ns at TA = 125°C.

5.  For fCL, set switch S1 to low position.  Requirements for MAX clock frequency (fCL) are established by

setting the parameter to the limits given in table III and observing proper output state changes.

FIGURE 4.  Switching time test circuit and waveforms - Continued.

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