MIL-M-38510-57 Microcircuits, Digital, Cmos, Static Shift Register, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/57F

TABLE I. Electrical performance characteristics - Continued.

Test	Symbol	Conditions 1/ VSS = 0 V -55°C ≤ TC ≤ 125°C Unless otherwise specified	Device type	Limits		Unit
Test	Symbol		Device type	Min	Max	Unit
Maximum CLOCK frequency	fCL	VDD = 5.0 V dc, CL = 50 pF	01,02	700		kHz
			03,04	700
			05	550
			06	525
			51	1.4		MHz
			52	1.2
			53	1.5
			54	1.0
			55	800		kHz
			56	750		kHz
Setup time	tSETUP		01,51	115		ns
			53	150
			02,03, 04	500
			52,54	180
			05	680
			55	300
			06	650
			56	240
Minimum CLOCK pulse width	tp	VDD = 5.0 V, CL = 50 pF TC = 25°C	01,04,06	330
			02,03,05	400
			51,54	200
			52	180
			53,56	250
			55	300
Minimum reset pulse width	tp(RS)		03,05	400		ns
Minimum high level AE, P/S, A/S pulse width	tPH		06,56	480		ns

1/ Complete terminal conditions shall be as specified in table III.

2/ Input current at one input node.