MIL-M-38510-57 Microcircuits, Digital, Cmos, Static Shift Register, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/57F

Device types 03 and 53

NOTES:

1. The pulse generators have the following characteristics: VGEN = VDD ±1 percent, tf and tr ≤ 20 ns, duty cycle = 50 percent, ZOUT = 50 n.

2. When measuring tPHL1, tPLH1, tTHL, and tTLH, set switch S1 to clock position. Momentarily set switch S2 to

position 2 to set outputs low and return to position 1.

3. When measuring tPHL2 set switch S2 to reset position. Momentarily set switch S2 to position 2 to set outputs low and return to position 1.

4. tSETUPH = tSETUPL = 350 ns at TA = 25°C and -55°C; tSETUPH = tSETUPL = 500 ns at TA = 125°C. For device types 03 and 53, tSETUPH = tSETUPL = 108 ns at TA = 25°C and -55°C; 150 ns at TA = 125°C.

5. For fCL, set switch S1 to clock. Requirements for MAX clock frequency (fCL) are established by setting

the parameter to the limits given in table III and observing proper output state changes.

FIGURE 4. Switching time test circuit and waveforms - Continued.