MIL-M-38510-57 Microcircuits, Digital, Cmos, Static Shift Register, Monolithic Silicon, Positive LogicThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/57F

Device types 02 and 52

NOTES:

1. The pulse generators have the following characteristics: VGEN = VDD ±1 percent, tf and tr ≤ 20 ns, duty cycle = 50 percent, ZOUT = 50n.

2. When measuring tPHL1 and tPLH1, set parallel serial control switch S1 to "LOW". Initially, apply clock pulse

with serial/parallel inputs at 0 V to set outputs low.

3. When measuring tPHL2, tPLH2, tTHL, and tTLH, set parallel serial control switch S1 to "HI". Initially, apply clock pulses with serial/parallel inputs at 0 V to set outputs low.

4. tSETUPH = tSETUPL = 350 ns at TA = 25°C and -55°C; tSETUPH = tSETUPL = 500 ns at TA = 125°C. For device type 02, tSETUPH = tSETUPL = 130 ns at TA = 25°C and -55°C; tSETUPH = tSETUPL = 180 ns at TA = 125°C.

5. Requirements for MAX clock frequency (fCL) are established by setting the parameter to the limits given

in table III and observing proper output state changes.

FIGURE 4. Switching time test circuit and waveforms - Continued.