MIL-M-38510/245B
APPENDIX A
FUNCTIONAL ALGORITHMS
A.1 SCOPE
A.1.1 Scope. Functional algorithms are test patterns which define the exact sequence of events used to verify proper operation of a random access (RAM) memory. Each algorithm serves a specific purpose for testing the
different modes of operation of the device It is understood that all manufacturers do not have the same test equipment;
therefore, it becomes the responsibility of each manufacturer to guarantee that the test patterns described herein are followed closely as possible, or equivalent patterns be used that serve the same purpose. Each manufacturer should
demonstrate that this condition will be met. This appendix is a mandatory part of the specification. The information
contained herein is intended for compliance.
A.2 APPLICABLE DOCUMENTS
This section is not applicable to this appendix. A.3 ALGORITHMS
A.3.1 Algorithm A. A.3.1.1 GALPAT.
a. Write a background pattern of 0's throughout memory. b. Write a 1 (test bit) at the first location.
c. Read location in sequence: read location 2, read test bit, read location 3, read test bit. Read in sequence until every location is read with test bit location.
d. Move the test bit to second location and repeat the sequence in step C. e. Repeat the sequence until each cell is used as test bit location.
f. Repeat steps b through e with a background pattern of 1's throughout memory. A.3.2 Algorithm B.
A.3.2.1 CHECKERBOARD.
a. Write 0 and 1 alternately in the first or even row.
b. Write 1 and 0 alternately in the second or odd row. c. Repeat steps a and b through all rows.
d. Read 0 and 1 alternately in the first or even row.
e. Read 1 and 0 alternately in the second or odd row. f. Repeat steps d and e through all rows.
g. Repeat steps a through f with complement data. A.3.3 Algorithm C.
A.3.3.1 ADDCOMP.
a. Write a true checkerboard throughout the memory.
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