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MIL-M-38510-245 Microcircuits, Digital, Cmos, 4096 Bit, Static Random Access Memory Sram, Bulk Silicon And Silicon On SapphireThis specification covers the detail requirements for bulk silicon and silicon on sapphire SOS, static, 4096 bit, random access memory microcircuits. Two product assurance classes, four radiation hardness assurance levels, and a choice of case outlines and lead finishes are provided and are reflected in the part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4

Pages 1 - 2 - 3 - 4 - 5 - 6 - 7 - 8 - 9 - 10 - 11 - 12 - 13 - 14 - 15 - 16 - 17 - 18 - 19 - 20 - 21 - 22 - 23 - 24 - 25 - 26 - 27 - 28 - 29 - 30 - 31 - 32 - 33 - 34 - 35 - 36 - 37 - 38 - 39 - 40 - 41 - 42 - 43 - 44 - 45 - 46 - 47 - 48 - 49 - 50 - 51 - 52 - 53 - 54 - 55 - 56 - 57 - 58 - 59 - 60 - 61 - 62 - 63 - 64 - 65 - 66 - 67 - 68 - 69 - 70 - 71 - 72 - 73 - 74 - 75 - 76 - 77 - 78


TABLE III.  Group A inspection for device type 01 - Continued.



Symbol


MIL-STD-

883 method


Case V

Terminal conditions 1/


Measured terminal

Test limits


Unit

11

12

13

14

15

16

17

18

Subgroup 9

TC = +25°C

Subgroup 10

TC = +125°C

Subgroup 11

TC = -55°C

Test No.

D

A11

A10

A9

A8

A7

A6

VDD

Min

Max

Min

Max

Min

Max

tAVQV

Fig. 4

74

11/

11/

11/

11/

11/

11/

11/

4.5 V

Q

120

120

120

ns

tELQV

75

"

"

"

"

"

"

"

"

"

120

120

120

"

tELQX   14/

76

"

"

"

"

"

"

"

"

"

5

5

5

"

tEHQZ   14/

77

"

"

"

"

"

"

"

"

"

50

50

50

"

Subgroup 12

TC = +25°C

Min

Max

IDDOP

78

12/

12/

12/

12/

12/

12/

12/

5.5 V

7

mA

See footnotes at end of table III.




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