TABLE III. Group A inspection for device types 01 and 02 - continued. 1/
Subgroup |
Symbol |
MIL-STD -883 method |
Test no. |
Pin measured |
Equation |
Limits |
|||||||
|
No. |
Value |
Unit |
Device type 01 |
Device type 02 |
|||||||||
Min |
Max |
Unit |
Min |
Max |
Unit |
||||||||
6 TA = -55°C (figure 2) |
AV+ |
4004 |
54 |
9 |
E26 |
V |
AV+ = 50 / (E15 - E26) |
+1,000 |
V/V |
+500 |
V/V |
||
|
AV- |
" |
55 |
" |
E27 |
" |
AV- = 50 / (E15 - E27) |
+1,000 |
" |
+500 |
" |
|||
7 TA = +25°C |
tLTHR |
" |
56 |
60 |
ns |
60 |
ns |
||||||
|
tHTHR |
" |
57 |
60 |
ns |
90 |
ns |
|||||||
|
tSTRL 3/ |
" |
58 |
15 |
ns |
|||||||||
1/ For devices marked with the "Q" certification mark, the parameters listed herein may be guaranteed if not tested to the limits specified herein in accordance with the manufacturer's QM plan.
2/ For device type 01, use -5 mV; for device type 02, use -10 mV.
3/ Device type 02 only.
4/ Test numbers 18, 20, 35, and 37, which require read and record measurements plus a calculation, may be omitted except when subgroups 2 and 3 are being performed for group A sampling inspections and group C end points.
� Represents delta.
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