MIL-M-38510-209 Microcircuit, Digital, 8192-Bit, Schottky, Bipolar, Programmable Read-Only Memory Prom, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, PROM microcircuits which employ thin film nichrome NiCr resistors, zapped vertical emitter, tungsten W, titanium tungsten TiW, or platinum silicide as the fusible link or programming element. Two product assurance class and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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TABLE III. Group A inspection for device types 04 and 09 - Continued.

Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; inputs not designated are high � 2.0 V, low s 0.8 V, or open).

Subgroup	Symbol	MIL- STD- 883 method	Cases J,K	1	2	3	4	5	6	7	8	9	10	11	12	13	14	15	16	17	18	19	20	21	22	23	24	Measured terminal	Test limits			Unit
			Test no.	A7	A6	A5	A4	A3	A2	A1	A0	01	02	03	GND	04	05	06	07	08	CE4	CE3	CE 2	CE 1	A9	A8	VCC		Min	Max
																														04	09
9 TC = +25°C	tPHL1 tPLH1 tPHL2 tPLH2	GALPAT Fig. 6 GALPAT Fig. 6 Sequen- tial Fig. 6 Sequen- tial Fig. 6	85 86 87 88	51 51 71 71	51 51 71 71	51 51 71 71	51 51 71 71	51 51 71 71	51 51 71 71	51 51 71 71	51 51 71 71	61 " " "	61 " " "	61 " " "	GND " " "	61 " " "	61 " " "	61 " " "	61 " " "	61 " " "	5.5V 5.5V 71 71	5.5V 5.5V 71 71	GND GND 71 71	GND GND 71 71	51 51 71 71	51 51 71 71	51 51 71 71	0utputs " " "		90 90 50 50	55 55 30 30	ns " " "
10	Same tests, terminal conditions, and limits as for subgroup 9, except TC = +125°C.
11	Same tests, terminal conditions, and limits as for subgroup 9, except TC = -55°C.

See footnotes at end of table.