MIL-M-38510-209 Microcircuit, Digital, 8192-Bit, Schottky, Bipolar, Programmable Read-Only Memory Prom, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, PROM microcircuits which employ thin film nichrome NiCr resistors, zapped vertical emitter, tungsten W, titanium tungsten TiW, or platinum silicide as the fusible link or programming element. Two product assurance class and a choice of case outlines and lead finishes are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.4.

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TABLE III. Group A inspection for device type 01 - Continued.

Terminal conditions (outputs not designated are open or resistive coupled to GND or voltage; inputs not designated are high � 2.0 V, low s 0.8 V, or open).

Subgroup	Symbol	MIL- STD- 883 method	Cases V,X	1	2	3	4	5	6	7	8	9	10	11	12	13	14	15	16	17	18	Meas. terminal	Test limits		Unit
Subgroup	Symbol	MIL- STD- 883 method	Test no.	A6	A5	A4	A3	A0	A1	A2	A10	GND	CE 1	04	03	02	01	A9	A8	A7	VCC	Meas. terminal	Min	Max	Unit
8	Same tests, terminal conditions, and limits as for subgroup 7, except TC = +125°C and -55°C.
9 TC = +25°C	tPHL1 tPLH1 tPHL2 tPLH2	GALPAT Fig. 6 GALPAT Fig. 6 Sequen- tial Fig. 6 Sequen- tial Fig. 6	47 48 49 50	51 51 71 71	51 51 71 71	51 51 71 71	51 51 71 71	51 51 71 71	51 51 71 71	51 51 71 71	51 51 71 71	GND " " "	GND GND 71 71	61 " " "	61 " " "	61 " " "	61 " " "	51 51 71 71	51 51 71 71	51 51 71 71	51 51 71 71	0utputs " " "		125 125 60 60 81	ns " " "
10	Same tests, terminal conditions, and limits as for subgroup 9, except TC = +125°C.
11	Same tests, terminal conditions, and limits as for subgroup 9, except TC = -55°C.

See footnotes at end of table.