MIL-M-38510/209H
Device types 05 and 06
NOTES:
1. Test table for devices programmed in accordance with an altered item drawing may be replaced by the equivalent tests which apply to the specific program configuration for the resulting read-only memory.
2. CL = 30 pF minimum, including jig and probe capacitance; R1 = 330 n ±25% and R2 = 680 n ±20 %.
3. Outputs may be under load simultaneously.
FIGURE 6. Switching time test circuit - Continued.
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