TABLE III. Group A inspection for device type 54 - Continued.
Symbol |
MIL- STD- 883 method |
Cases E,F,Z |
Terminal conditions 11 |
Measured terminal |
Test limits |
Unit |
||||||||||||||||||||
Symbol |
J |
Kd |
H |
G |
F |
E |
Kb |
VSS |
Kc |
Ka |
D |
C |
B |
A |
EX |
VDD |
Subgroup 9 TC = +25°C |
Subgroup 10 TC = +125°C |
Subgroup 11 TC = -55°C |
|||||||
Test no. |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
Min |
Max |
Min |
Max |
Min |
Max |
||||
tTLH |
3004 (Fig. 5) |
310 311 312 313 314 315 316 317 |
OUT " " " " " " " |
5.0V " " " " " " " |
GND " " " " " " IN |
GND " " " " " IN GND |
GND " " " " IN GND " |
GND " " " IN GND " " |
GND " " " " " " " |
GND " " " " " " " |
GND " " " " " " " |
GND " " " " " " " |
GND " " IN GND " " " |
GND GND IN GND " " " " |
GND IN GND " " " " " |
IN GND " " " " " " |
GND " " " " " " " |
5.0V " " " " " " " |
J " " " " " " " |
6 " " " " " " " |
115 " " " " " " " |
7 " " " " " " " |
140 " " " " " " " |
5 " " " " " " " |
100 " " " " " " " |
ns " " " " " " " |
tPLZ |
3003 (Fig. 16) |
318 |
" |
IN |
GND |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
5.0V |
" |
" |
Kd to J |
18 |
350 |
25 |
490 |
18 |
350 |
" |
tPHZ |
319 |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
GND |
" |
" |
" |
18 |
350 |
25 |
490 |
18 |
350 |
" |
|
tPZL |
320 |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
5.0V |
" |
" |
" |
23 |
450 |
32 |
630 |
23 |
450 |
" |
|
tPZH |
321 |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
GND |
" |
" |
" |
23 |
450 |
32 |
630 |
23 |
450 |
" |
11 Pins not designated may be "high" level logic, "low" level logic, or open. Exceptions are as follows: For VIC(POS) tests, the VSS terminal shall be open; for VIC(NEG) tests, the VDD terminal shall be open; for ISS tests, the outputs shall be open.
21 ISS measurements shall be performed in sequence.
31 The device manufacturer may, at his option, measure IIL and IIH at +25°C for each individual input or measure all inputs together.
41 See 4.4.1c.
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