TA8LE III. Group A inspection for device type 52 - Continued.
Symbol |
MIL- STD- 883 method |
Cases E,F,N,Z |
Terminal conditions 1/ |
Measured terminal |
Test limits |
Unit |
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Symbol |
84 |
A3 |
83 |
A2 |
82 |
A1 |
81 |
VSS |
Ka |
D1 |
D2 |
D3 |
D4 |
Kb |
A4 |
VDD |
Subgroup 9 TC = +25°C |
Subgroup 10 TC = +125°C |
Subgroup 11 TC = -55°C |
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Test no. |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
Min |
Max |
Min |
Max |
Min |
Max |
||||
tPHL |
3003 (Fig. 4) |
158 159 160 161 162 163 164 165 166 167 168 |
GND " " " " " " 5.0V GND " " |
IN GND " " 5.0V GND " " " " " |
GND " " " " " " " 5.0V GND " |
GND IN GND " " 5.0V GND " " " " |
GND " " " " " " " " 5.0V GND |
GND GND IN GND " " 5.0V GND " " " |
GND " " " " " " " " " 5.0V |
GND " " " " " " " " " " |
5.0V " " IN " " " 5.0V " " " |
OUT OUT OUT |
OUT OUT OUT |
OUT OUT OUT |
OUT OUT |
5.0V " " " " " " IN " " " |
GND " " 5.0V GND " " " " " " |
5.0V " " " " " " " " " " |
D3 D2 D1 D4 D3 D2 D1 D4 D3 D2 D1 |
13 " " " " " " " " " " |
300 " " " " " " " " " " |
18 " " " " " " " " " " |
420 " " " " " " " " " " |
13 " " " " " " " " " " |
300 " " " " " " " " " " |
ns " " " " " " " " " " |
tPLH |
169 170 171 172 173 174 175 176 177 178 179 180 181 182 183 184 |
IN GND " " " " " " " " " " 5.0V GND " " |
" " " " " IN GND " " 5.0V GND " " " " " |
" IN GND " " " " " " " " " " 5.0V GND " |
" " " " " " IN GND " " 5.0V GND " " " " |
" " IN GND " " " " " " " " " " 5.0V GND |
" " " " " " " IN GND " " 5.0V GND " " " |
GND " " IN GND " " " " " " " " " " 5.0V |
" " " " " " " " " " " " " " " " |
" " " " " " " " IN " " " 5.0V " " " |
OUT OUT OUT OUT |
OUT OUT OUT OUT |
OUT OUT OUT OUT |
OUT OUT OUT OUT |
5.0V " " " " " " " " " " " IN " " " |
" " " " IN GND " " 5.0V GND " " " " " " |
" " " " " " " " " " " " " " " " |
D4 D3 D2 D1 D4 D3 D2 D1 D4 D3 D2 D1 D4 D3 D2 D1 |
" " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
|
tTHL |
3004 (Fig. 4) |
185 186 187 188 189 190 191 192 193 194 195 196 197 198 199 200 |
IN GND " " " " " " " " " " 5.0V GND " " |
" " " " " IN GND " " 5.0V GND " " " " " |
" IN GND " " " " " " " " " " 5.0V GND " |
" " " " " " IN GND " " 5.0V GND " " " " |
" " IN GND " " " " " " " " " " 5.0V GND |
" " " " " " " IN GND " " 5.0V GND " " " |
GND " " IN GND " " " " " " " " " " 5.0V |
" " " " " " " " " " " " " " " " |
" " " " " " " " IN " " " 5.0V " " " |
OUT OUT OUT OUT |
OUT OUT OUT OUT |
OUT OUT OUT OUT |
OUT OUT OUT OUT |
5.0V " " " " " " " " " " " IN " " " |
" " " " IN GND " " 5.0V GND " " " " " " |
" " " " " " " " " " " " " " " " |
D4 D3 D2 D1 D4 D3 D2 D1 D4 D3 D2 D1 D4 D3 D2 D1 |
10 " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
14 " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
10 " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
tTLH |
201 202 203 204 205 206 207 208 209 210 211 212 213 214 215 216 |
IN GND " " " " " " " " " " 5.0V GND " " |
" " " " " IN GND " " 5.0V GND " " " " " |
" IN GND " " " " " " " " " " 5.0V GND " |
" " " " " " IN GND " " 5.0V GND " " " " |
" " IN GND " " " " " " " " " " 5.0V GND |
" " " " " " " IN GND " " 5.0V GND " " " |
GND " " IN GND " " " " " " " " " " 5.0V |
" " " " " " " " " " " " " " " " |
" " " " " " " " IN " " " 5.0V " " " |
OUT OUT OUT OUT |
OUT OUT OUT OUT |
OUT OUT OUT OUT |
OUT OUT OUT OUT |
5.0V " " " " " " " " " " " IN " " " |
" " " " IN GND " " 5.0V GND " " " " " " |
" " " " " " " " " " " " " " " " |
D4 D3 D2 D1 D4 D3 D2 D1 D4 D3 D2 D1 D4 D3 D2 D1 |
" " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " |
1/ Pins not designated may be "high" level logic, "low" level logic, or open. Exceptions are as follows: For VIC(POS) tests, the VSS terminal shall be open; for VIC(NEG) tests, the VDD terminal shall be open; for ISS tests, the outputs shall be open.
2/ ISS measurements shall be performed in sequence.
3/ The VIL and VIH input test requirements are acceptable if the output state limit is met, attributes data required.
4/ The device manufacturer may, at his option, measure IIL and IIH at +25°C for each individual input or measure all inputs together.
5/ See 4.4.1c.
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