TABLE III. Group A inspection for device type 04 - Continued.
Symbol |
MIL- STD- 883 method |
Cases E,F,Z |
Terminal conditions 11 |
Measured terminal |
Test limits |
Unit |
||||||||||||||||||||
Symbol |
J |
Kd |
H |
G |
F |
E |
Kb |
VSS |
Kc |
Ka |
D |
C |
B |
A |
EX |
VDD |
Subgroup 9 TC = +25°C |
Subgroup 10 TC = +125°C |
Subgroup 11 TC = -55°C |
|||||||
Test no. |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
Min |
Max |
Min |
Max |
Min |
Max |
||||
tPHL9 |
3003 (Fig. 13) |
210 |
OUT |
5.0 V |
GND |
GND |
GND |
GND |
GND |
GND |
GND |
IN |
GND |
GND |
GND |
GND |
GND |
5.0 V |
Ka to J |
34 |
690 |
38 |
760 |
30 |
595 |
ns |
tPLH9 |
211 |
" |
" |
" |
" |
" |
" |
GND |
" |
" |
IN |
" |
" |
" |
" |
" |
" |
Ka to J |
31 |
625 |
37 |
730 |
28 |
555 |
" |
|
tPHL10 |
3003 (Fig. 14) |
212 |
" |
" |
" |
" |
" |
" |
IN |
" |
" |
GND |
" |
" |
" |
" |
" |
" |
Kb to J |
27 |
535 |
31 |
615 |
23 |
460 |
" |
tPLH10 |
213 |
" |
" |
" |
" |
" |
" |
IN |
" |
" |
" |
" |
" |
" |
" |
" |
" |
Kb to J |
26 |
515 |
30 |
605 |
23 |
465 |
" |
|
tPHL11 |
3003 (Fig. 15) |
214 |
" |
" |
" |
" |
" |
" |
GND |
" |
IN |
" |
" |
" |
" |
" |
" |
" |
Kc to J |
21 |
420 |
24 |
475 |
18 |
360 |
" |
tPLH11 |
215 |
" |
" |
" |
" |
" |
" |
" |
" |
IN |
" |
" |
" |
" |
" |
" |
" |
Kc to J |
19 |
380 |
22 |
445 |
17 |
340 |
" |
|
tTHL |
3004 (Fig. 5) |
216 217 218 219 220 221 222 223 |
" " " " " " " " |
" " " " " " " " |
" " " " " " " IN |
" " " " " " IN GND |
" " " " " IN GND " |
" " " " IN GND " " |
" " " " " " " " |
" " " " " " " " |
GND " " " " " " " |
" " " " " " " " |
" " " IN GND " " " |
" " IN GND " " " " |
" IN GND " " " " " |
IN GND " " " " " " |
" " " " " " " " |
" " " " " " " " |
J " " " " " " " |
7 " " " " " " " |
135 " " " " " " " |
8 " " " " " " " |
160 " " " " " " " |
6 " " " " " " " |
115 " " " " " " " |
" " " " " " " " |
tTLH |
224 225 226 227 228 229 230 231 |
" " " " " " " " |
" " " " " " " " |
GND " " " " " " IN |
" " " " " " IN GND |
" " " " " IN GND " |
" " " " IN GND " " |
" " " " " " " " |
" " " " " " " " |
" " " " " " " " |
" " " " " " " " |
" " " IN GND " " " |
" " IN GND " " " " |
" IN GND " " " " " |
IN GND " " " " " " |
" " " " " " " " |
" " " " " " " " |
" " " " " " " " |
6 " " " " " " " |
115 " " " " " " " |
7 " " " " " " " |
140 " " " " " " " |
5 " " " " " " " |
100 " " " " " " " |
" " " " " " " " |
|
tPLZ |
3003 (Fig. 16) |
232 |
" |
IN |
GND |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
5.0 V |
" |
" |
Kd to J |
18 |
350 |
25 |
490 |
18 |
350 |
" |
tPHZ |
233 |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
GND |
" |
" |
" |
18 |
350 |
25 |
490 |
18 |
350 |
" |
|
tPZL |
234 |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
5.0 V |
" |
" |
" |
23 |
450 |
32 |
630 |
23 |
450 |
" |
|
tPZH |
235 |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
GND |
" |
" |
" |
23 |
450 |
32 |
630 |
23 |
450 |
" |
11 Pins not designated shall be "high" level logic, "low" level logic, or open. Exceptions are as follows: For VIC(POS) tests, the VSS terminal shall be open; for VIC(NEG) tests, the VDD terminal shall be open; for ISS tests, the output shall be open.
21 During VIC(POS) and VIC(NEG) tests, the VSS terminals respectively shall be open.
31 ISS measurements shall be performed in sequence.
41 VIL1 = 1.1 V at +25°C; 0.8 V at +125°C; 1.35 V at -55°C.
51 VIL2 = 2.8 V at +25°C; 2.55 V at +125°C; 1.35 V at -55°C.
61 VIH1 = 3.8 V at +25°C; 3.6 V at +125°C; 3.95 V at -55°C.
71 VIH2 = 9.5 V at +25°C; 9.25 V at +125°C; 9.75 V at -55°C.
81 The device manufacturer may, at his option, measure IIL and IIH at +25°C for each individual input or measure all inputs together.
91 See 4.4.1c.
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