MIL-M-38510-53 Microcircuits, Digital, Cmos, Complimentary Pair Plus Inverter, And-Or-Select Exclusive Or Gates, Expandable 8-Input Gate Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/53F

iii For device types 01 and 51:

(a) Connect pins 2, 11, and 14 together. (b) Connect pins 4, 7, and 9 together.

(d) Connect pins 1 and 5 together.

iv VDD = 12.5 V minimum and 15 V maximum for device types 01, 02, 03, and 04.

VDD = 15 V minimum and 18 V maximum for device types 51, 52, 53, and 54. VDD/2 = VDD/2 ± 1.0 V. VSS = 0.0 V.

d. Interim and final electrical test parameters shall be as specified in table II.

e. For class S devices, post dynamic burn-in, or class B devices, post static burn-in, electrical parameter measurements may, at the manufacturer's option, be performed separately or included in the final electrical parameter requirements.

f. When device types 01 through 04 are qualified by extension (see 4.3.1), they shall be screened in accordance with the requirements for corresponding device types 51 through 54, respectively.

TABLE II. Electrical test requirements.

Line no.	MIL-PRF-38535 test requirements	Class S device 1/			Class B device 1/
Line no.	MIL-PRF-38535 test requirements	Ref. par.	Table III Subgroups 2/	Table IV delta limits 3/	Ref. par.	Table III subgroups 2/	Table IV delta limits 3/
1	Interim electrical parameters		1			1
2	Static burn-in I (method 1015)	4.2c 4.5.2
3	Same as line 1		1	�
4	Static burn-in II (method 1015)	4.2c 4.5.2			4.2c 4.5.2	4/
5	Same as line 1	4.2e	1*	�	4.2e	1*	�
6	Dynamic burn-in (method 1015)	4.2c 4.5.2
7	Same as line 1	4.2e	1*	�
8	Final electrical parameters (method 5004)		1*, 2, 3, 9			1*, 2, 3, 9
9	Group A test requirements (method 5005)	4.4.1	1, 2, 3, 4, 9, 10, 11		4.4.1	1, 2, 3, 4, 9, 10, 11
10	Group B test when using method 5005 QCI option	4.4.2	1, 2, 3, 9, 10, 11	�
11	Group C end- point electrical parameters (method 5005)				4.4.3	1, 2, 3	�
12	Group D end- point electrical parameters (method 5005)	4.4.4	1, 2, 3		4.4.4	1, 2, 3

1/ Blank spaces indicate tests are not applicable.

2/ * indicates PDA applies to subgroup 1 (see 4.2.1).

3/ � indicates delta limits shall be required only on table III subgroup 1, where specified, and the delta values shall be computed with reference to the previous interim electrical parameters.

4/ The device manufacturer may at his option either perform delta measurements or within 24 hours after burn-in (or removal of bias) perform the final electrical parameter measurements.