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MIL-M-38510-53 Microcircuits, Digital, Cmos, Complimentary Pair Plus Inverter, And-Or-Select Exclusive Or Gates, Expandable 8-Input Gate Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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TA8LE III. Group A inspection for device type 02 - Continued.

Symbol

MIL-

STD-

883 method

Cases

E,F,N,Z

Terminal conditions 1/

Symbol

VSS

Test

no.

tTLH

3004

(Fig. 4)

169

170

171

172

173

174

175

176

177

178

179

180

181

182

183

184

GND "

" " " " " " " " "

5.0V GND "

GND

" " " "

IN GND "

5.0V GND "

" " " "

GND

IN GND "

" " " " " " " " "

5.0V GND GND

GND

" " " " "

IN GND "

5.0V GND "

" " "

GND

GND IN GND "

" " " " " " " " "

5.0V GND

GND

" " " " " "

IN GND "

5.0V GND "

" "

GND

" " IN

GND "

" " " " " " " " "

5.0V

GND

" " " " " " " " " " " " " " "

5.0V

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OUT OUT OUT OUT

1/ Pins not designated may be "high" level logic, "low" level logic, or open. Exceptions are as follows: For VIC(POS) tests, the VSS terminal shall be open; for VIC(NEG) tests, the VDD terminal shall be open; for ISS tests, the outputs shall be open.

2/ VIH1 = 3.8 V at +25°C, 3.5 V at +125°C; 3.95 V at -55°C.

3/ IOH1 = -0.1 mA at +25°C; -0.1 mA at +125°C; -0.1 mA at -55°C.

4/ IOH2 = -0.25 mA at +25°C; -0.175 mA at +125°C; -0.31 mA at -55°C.

5/ VIH2 = 9.5 V at +25°C; 9.25 V at +125°C; 9.75 V at -55°C.

6/ VIL1 = 1.1 V at +25°C; 0.85 V at +125°C; 1.35 V at -55°C.

7/ IOL1 = 0.23 mA at +25°C; 0.23 mA at +125°C; 0.23 mA at -55°C.

8/ IOL2 = 0.5 mA at +25°C; 0.4 mA at +125°C; 0.55 mA at -55°C.

9/ VIL2 = 2.8 V at +25°C; 2.55 V at +125°C; 3.05 V at -55°C.

10/ The device manufacturer may, at his option, measure IIL and IIH at +25°C for each individual input or measure all inputs together.

11/ See 4.4.1c.