TABLE III. Group A inspection for device type 51 - Continued.
Symbol |
MIL- STD- 883 method |
Cases A, C,D,T,X,Y |
Terminal conditions 1/ |
Measured terminal |
Test limits |
Unit |
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Symbol |
2aY |
2aS |
2A |
2bS |
2bY |
1A |
VSS |
1bY |
3bS |
3A |
3aS |
3Y |
1aY |
VDD |
Subgroup 1 TC = +25°C |
Subgroup 2 TC = +125°C |
Subgroup 3 TC = -55°C |
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Test no. |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
Min |
Max |
Min |
Max |
Min |
Max |
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IIH1 5/ |
3010 |
45 |
(5) 2/ |
18.0V |
18.0V |
GND |
(1) 2/ |
18.0V |
GND |
(13) 2/ |
GND |
18.0V |
18.0V |
(8) 2/ |
18.0V |
All inputs together |
6.0 |
nA |
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IIH2 5/ |
46 47 48 |
" " " |
" " " |
GND 18.0V GND |
" " " |
" " " |
18.0V GND " |
" " " |
" " " |
" " " |
GND GND 18.0V |
" " " |
" " " |
" " " |
1A 2A 3A |
1.0 " " |
45 " " |
" " " |
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IIL1 5/ |
3009 |
49 |
" |
" |
GND |
" |
" |
" |
" |
" |
" |
GND |
" |
" |
" |
All inputs together |
-6.0 |
" |
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IIL2 5/ |
50 51 52 |
" " " |
" " " |
18.0V GND 18.0V |
" " " |
" " " |
" 18.0V 18.0V |
" " " |
" " " |
" " " |
18.0V 18.0V GND |
" " " |
" " " |
" " " |
1A 2A 3A |
-1.0 " " |
-45 " " |
" " " |
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Subgroup 4 TC = +25°C |
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Min |
Max |
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CI |
3012 |
53 54 55 |
(5) 2/ " " |
GND " " |
6/ |
GND " " |
(1) 2/ " " |
6/ |
GND " " |
(13) 2/ " " |
GND " " |
6/ |
GND " " |
(8) 2/ " " |
GND " " |
1A 2A 3A |
12 " " |
pF " " |
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Subgroup 9 TC = +25°C |
Subgroup 10 TC = +125°C |
Subgroup 11 TC = -55°C |
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Min |
Max |
Min |
Max |
Min |
Max |
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tPHL |
3003 (Fig. 4) |
56 57 58 |
(5) 2/ " " |
5.0V " " |
GND IN GND |
GND " " |
(1) 2/ " " |
IN GND GND |
GND " " |
(13) 2/ " " |
GND " " |
GND GND IN |
5.0V " " |
(8) 2/ " " |
5.0V " " |
1A to 1aY 2A to 2aY 3A to 3Y |
6 " " |
110 " " |
9 " " |
155 " " |
6 " " |
110 " " |
ns " " |
|
tPLH |
59 60 61 |
" " " |
" " " |
GND IN GND |
" " " |
" " " |
IN GND GND |
" " " |
" " " |
" " " |
GND GND IN |
" " " |
" " " |
" " " |
1A to 1aY 2A to 2aY 3A to 3Y |
" " " |
" " " |
" " " |
" " " |
" " " |
" " " |
" " " |
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tTHL |
3004 (Fig. 4) |
62 63 64 |
" " " |
" " " |
GND IN GND |
" " " |
" " " |
IN GND GND |
" " " |
" " " |
" " " |
GND GND IN |
" " " |
" " " |
" " " |
1aY 2aY 3Y |
" " " |
200 " " |
" " " |
280 " " |
" " " |
200 " " |
" " " |
|
tTLH |
65 66 67 |
" " " |
" " " |
GND IN GND |
" " " |
" " " |
IN GND GND |
" " " |
" " " |
" " " |
GND GND IN |
" " " |
" " " |
" " " |
1aY 2aY 3Y |
" " " |
" " " |
" " " |
" " " |
" " " |
" " " |
" " " |
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1/ Pins not designated may be "high" level logic, "low" level logic, or open. Exceptions are as follows: For VIC(POS) tests, the VSS terminal shall be open; for VIC(NEG) tests, the VDD terminal shall be open; for ISS tests, the outputs shall be open.
2/ Terminals in parentheses are connected together as indicated by the included number.
3/ ISS measurements shall be performed in sequence.
4/ The VIL and VIH input test requirements are acceptable if the output state list is met, attributes data required.
5/ The device manufacturer may, at his option, measure IIL and IIH at +25°C for each individual input or measure all inputs together.
6/ See 4.4.1c.
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