TA8LE III. Group A inspection for device type 03 - Continued.
Symbol |
MIL- STD- 883 method |
Cases A, C,D,T,X,Y |
Terminal conditions 1/ |
||||||||||
Symbol |
1A |
18 |
1Y |
2Y |
2A |
28 |
VSS |
3A |
38 |
3Y |
4Y |
||
Test no. |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
||
tPHL |
3003 (Fig. 4) |
102 103 104 105 106 107 108 109 |
IN GND " " " " " " |
GND IN GND " " " " " |
OUT OUT |
OUT OUT |
GND GND IN GND " " " " |
GND " " IN GND " " " |
GND " " " " " " " |
GND " " " IN GND " " |
GND " " " " IN GND " |
OUT OUT |
OUT OUT |
tPLH |
110 111 112 113 114 115 116 117 |
IN GND " " " " " " |
" IN GND " " " " " |
OUT OUT |
OUT OUT |
" " IN GND " " " " |
" " " IN GND " " " |
" " " " " " " " |
" " " " IN GND " " |
" " " " " IN GND " |
OUT OUT |
OUT OUT |
|
tTHL |
3004 (Fig. 4) |
118 119 120 121 122 123 124 125 |
IN GND " " " " " " |
" IN GND " " " " " |
OUT OUT |
OUT OUT |
" " IN GND " " " " |
" " " IN GND " " " |
" " " " " " " " |
" " " " IN GND " " |
" " " " " IN GND " |
OUT OUT |
OUT OUT |
tTLH |
126 127 128 129 130 131 132 133 |
IN GND " " " " " " |
" IN GND " " " " " |
OUT OUT |
OUT OUT |
" " IN GND " " " " |
" " " IN GND " " " |
" " " " " " " " |
" " " " IN GND " " |
" " " " " IN GND " |
OUT OUT |
OUT OUT |
1/ Pins not designated may be "high" level logic, "low" level logic, or open. Exceptions are as follows: For VIC(POS) tests, the VSS terminal shall be open; for VIC(NEG) tests, the VDD terminal shall be open; for ISS tests, the outputs shall be open.
2/ ISS measurements shall be performed in sequence.
3/ VIL1 = 1.1 V at +25°C; 0.35 V at +125°C; 1.35 V at -55°C.
4/ IOH1 = -0.1 mA at +25°C; -0.1 mA at +125°C; -0.1 mA at -55°C.
5/ IOH2 = -0.2 mA at +25°C; -0.13 mA at +125°C; -0.25 mA at -55°C.
6/ VIL2 = 2.8 V at +25°C; 2.55 V at +125°C; 3.05 V at -55°C.
7/ VIH1 = 3.8 V at +25°C; 3.5 V at +125°C; 3.95 V at -55°C.
8/ IOL1 = 0.23 mA at +25°C; 0.23 mA at +125°C; 0.23 mA at -55°C.
9/ IOL2 = 0.40 mA at +25°C; 0.28 mA at +125°C; 0.5 mA at -55°C.
10/ VIH2 = 9.5 V at +25°C; 9.25 V at +125°C; 9.75 V at -55°C.
11/ IOL3 = 0.60 mA at +25°C; 0.56 mA at +125°C; 1.0 mA at -55°C.
12/ The device manufacturer may, at his option, measure IIL and IIH at +25°C for each individual input or measure all inputs together.
13/ See 4.4.1c.
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