TABLE III. Group A inspection for device type 53 - Continued.
Symbol |
MIL- STD- 883 test method |
Cases E,F,N, Z |
Terminal conditions 11 |
Measured terminal |
Test limits |
Unit |
||||||||||||||||||||
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
Subgroup 9 TA = 25°C |
Subgroup 10 TA = 125°C |
Subgroup 11 TA = -55°C |
||||||||
Test no. |
Q4 |
Q1 |
R1 |
S1 |
E |
S2 |
R2 |
VSS |
Q2 |
Q3 |
R3 |
S3 |
NC |
S4 |
R4 |
VDD |
Min |
Max |
Min |
Max |
Min |
Max |
||||
tPHL R |
3003 Fig. 15 " |
120 121 122 123 |
OUT |
OUT |
IN |
5.0V " " " |
IN |
GND " " " |
OUT |
OUT |
IN |
IN |
5.0V " " " |
R1 to Q1 R2 to Q2 R3 to Q3 R4 to Q4 |
10 " " " |
320 " " " |
14 " " " |
370 " " " |
10 " " " |
270 " " " |
ns " " " |
|||||
tPLH |
" " " " |
124 125 126 127 |
OUT |
OUT |
IN |
" " " " |
IN |
" " " " |
OUT |
OUT |
IN |
IN |
" " " " |
S1 to Q1 S2 to Q2 S3 to Q3 S4 to Q4 |
10 " " " |
200 " " " |
10 " " " |
245 " " " |
9 " " " |
185 " " " |
" " " " |
|||||
tPZH |
Fig. 16 |
128 |
OUT |
GND |
5.0V |
IN |
GND |
GND |
" |
GND |
GND |
GND |
GND |
" |
E to Q1 |
230 |
340 |
230 |
" |
|||||||
tPHZ |
" " " |
129 130 131 |
OUT |
" " " |
GND " " |
" " " |
5.0V GND " |
" " " |
" " " |
OUT |
OUT |
" " " |
GND 5.0V GND |
" " 5.0V |
" " " |
" " " |
E to Q2 E to Q3 E to Q4 |
" " " |
" " " |
" " " |
" " " |
|||||
tPZL |
" |
132 |
OUT |
5.0V |
" |
" |
" |
" |
" |
" |
" |
GND |
" |
" |
E to Q1 |
180 |
240 |
180 |
" |
|||||||
tPLZ |
" " " |
133 134 135 |
OUT |
GND " " |
" " " |
" " " |
" " " |
5.0V GND GND |
" " " |
OUT |
OUT |
" 5.0V GND |
" " " |
" " " |
" " 5.0V |
" " " |
E to Q2 E to Q3 E to Q4 |
" " " |
" " " |
" " " |
" " " |
|||||
tTHL |
3004 Fig. 15 " |
136 137 138 139 |
OUT |
OUT |
IN |
5.0V " " " |
IN |
" " " " |
OUT |
OUT |
IN |
IN |
" " " " |
Q1 Q2 Q3 Q4 |
10 " " " |
200 " " " |
14 " " " |
245 " " " |
10 " " " |
185 " " " |
" " " " |
|||||
tTLH |
" " " " |
140 141 142 143 |
OUT |
OUT |
IN |
" " " " |
IN |
" " " " |
OUT |
OUT |
IN |
IN |
" " " " |
Q1 Q2 Q3 Q4 |
10 " " " |
300 " " " |
18 " " " |
360 " " " |
10 " " " |
250 " " " |
" " " " |
|||||
11 Pins not designated may be "high" level logic, "low" level logic, or open. Exceptions are as follows: VIC(pos) tests, the VSS terminal shall be open; VIC(neg) tests, the VDD terminal shall be open; ISS tests, the output terminals shall be open.
21 Test numbers 19 thru 24 shall be run in sequence.
31 The device manufacturer may, at his options, measure IIL and IIH at 25°C for each individual input or measure all inputs together.
41 See 4.4.1c.
51 Test numbers 114 thru 119 shall be run in sequence and the functional tests shall be performed with VIH and VDD ≤ 5.0 V and ; 18.0 V.
61 L = VSS + 0.5 V maximum and H = VDD - 0.5 V minimum.
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business