MIL-M-38510-51 Microcircuits, Digital, Cmos, Flip-Flops And Latchets, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/51F

NOTES:

1.  Pulse generator number 1 has the following characteristics: Vgen = VDD ±1%, duty cycle = 50%, tr  and tf  = 20 ± 2.0 ns and pulse repetition period = 5.0 ± 0.5 µs.

2.  Pulse generator number 2 has the following characteristics: Vgen = VDD ±1%, duty cycle = variable,

tr  and tf  = 20 ± 2.0 ns and pulse repetition period = 5.0 ± 0.5 µs.

3.  Identical switching measurements are obtained from flip-flop number 1 and flip-flop number 2.

4.  For J input test, connect terminal 5 to terminal 16 and terminal 6 to pulse generator

number 2.  Similar terminal connections are required for measurement on flip-flop number 2.

5.  Requirements for setup times and hold times are established by setting the parameter to the limit given in table III and observing proper output state changes.

FIGURE 14.  Setup and hold time test circuit and waveforms for device types 02 and 52.

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