MIL-M-38510-51 Microcircuits, Digital, Cmos, Flip-Flops And Latchets, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/51F

NOTES:

1. The pulse generator has the following characteristics: Vgen = VDD ± 1.0%, duty cycle = 50%, tr and tf = 20 ± 2.0 ns and pulse repetition period = 5.0 ± 0.5 µs.

2. Identical switching measurements are obtained from flip-flop number 1 and flip-flop number 2.

3. For K input test, connect terminal 6 to terminal 16 and terminal 5 to terminal 1. Similar connection are required for measurements on flip-flop number 2.

4. For fCL and tp, the pulse repetition period is variable.

5. Requirements for max clock frequency (fCL), max clock rise time and minimum clock pulse width are

established by setting the parameter to the limit given in table III and observing proper output state

changes.

FIGURE 12. Switching time test circuit and waveforms for device types 02 and 52.