MIL-M-38510-51 Microcircuits, Digital, Cmos, Flip-Flops And Latchets, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/51F

NOTES:

1.  Pulse generator number 1 has the following characteristics: Vgen = VDD ±1%, duty cycle = 50%, tr  and tf  = 20 ± 2.0 ns and pulse repetition period = 5.0 ± 0.5 µs.

2.  Pulse generator number 2 has the following characteristics: Vgen = VDD ±1%, duty cycle = variable, tr  and tf  = 20 ± 2.0 ns and pulse repetition period = twice that of pulse generator number 1.

3.  Identical switching measurements are obtained from either flip-flop number 1 or flip-flop number 2.

4.  Requirements for hold times are considered met if proper output state changes occur with tHOLD

set to that given in the limits column of table III.

FIGURE 9.  Hold time test circuit and waveforms for device types 01 and 51.

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