TABLE III. Group A inspection for device type 02 - Continued.
Symbol |
MIL- STD- 883 test method |
Cases E,F,N, and Z |
Terminal conditions 1/ |
Measured terminal |
Test limits |
Unit |
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1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
Subgroup 9 TA = 25°C |
Subgroup 10 TA = 125°C |
Subgroup 11 TA = -55°C |
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Test no. |
Q2 |
Q2 |
CLK2 |
RS2 |
K2 |
J2 |
SET2 |
VSS |
SET1 |
J1 |
K1 |
RS1 |
CLK1 |
Q1 |
Q1 |
VDD |
Min |
Max |
Min |
Max |
Min |
Max |
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tTLHCL 16/ |
Fig. 12 |
161 162 |
OUT |
IN |
GND " |
IN |
OUT |
5.0V " |
CLK2 CLK1 |
15 15 |
15 15 |
10 10 |
µs µs |
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tp 17/ |
" " |
163 164 |
OUT |
IN |
" " |
IN |
OUT |
" " |
CLK2 CLK1 |
300 300 |
450 450 |
300 300 |
ns " |
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tSHL |
Fig. 14 " " |
165 166 167 168 |
OUT OUT |
IN IN |
IN |
IN |
" " " " |
IN |
IN |
IN IN |
OUT OUT |
" " " " |
K2 to CLK2 J2 to CLK2 K1 to CLK1 J1 to CLK1 |
165 " " " |
225 " " " |
165 " " " |
" " " " |
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tSLH |
" " " " |
169 170 171 172 |
OUT OUT |
IN IN |
IN |
IN |
" " " " |
IN |
IN |
IN IN |
OUT OUT |
" " " " |
K2 to CLK2 J2 to CLK2 K1 to CLK1 J1 to CLK1 |
" " " " |
" " " " |
" " " " |
" " " " |
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tHLH |
" " " " |
173 174 175 176 |
OUT OUT |
IN IN |
IN |
IN |
" " " " |
IN |
IN |
IN IN |
OUT OUT |
" " " " |
K2 to CLK2 J2 to CLK2 K1 to CLK1 J1 to CLK1 |
150 " " " |
" " " " |
150 " " " |
" " " " |
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tHHL |
" " " " |
177 178 179 180 |
OUT OUT |
IN IN |
IN |
IN |
" " " " |
IN |
IN |
IN IN |
OUT OUT |
" " " " |
K2 to CLK2 J2 to CLK2 K1 to CLK1 J1 to CLK1 |
" " " " |
" " " " |
" " " " |
" " " " |
1/ Pins not designated may be "high" level logic, "low" level logic, or open. 11/ The device manufacturer may, at his option, measure IIL and IIH at 25°C Exceptions are as follows: VIC(pos) tests, the VSS terminal shall be for each individual input or measure all inputs together.
open; VIC(neg) tests, the VDD terminal shall be open; ISS tests, the output
terminals shall be open. 12/ See 4.4.1c.
2/ Test numbers 21 thru 34 shall be run in sequence.
13/ Test numbers 103 thru 134 shall be run in sequence and the functional
3/ IOH = -0.25 mA at 25°C, -0.175 mA at 125°C, -0.31 mA at -55°C. tests shall be performed with VIH and VDD ≤ 5.0 V and � 15.0 V.
4/ VIH1 = 3.8 V at 25°C, 3.6 V at 125°C, 3.95 V at -55°C. 14/ L = VSS + 0.5 V maximum and H = VDD - 0.5 V minimum.
5/ VIH2 = 9.5 V at 25°C, 9.25 V at 125°C, 9.75 V at -55°C. 15/ The maximum clock frequency (fCL) requirement is considered met if proper output state changes occur with the pulse repetition period set to that given
6/ IOL = 0.5 mA at 25°C, 0.35 mA at 125°C, 0.65 mA at -55°C. in the limits column.
7/ VIL1 = 1.1 V at 25°C, 0.85 V at 125°C, 1.35 V at -55°C. 16/ Pulse repetition period = 100 µs, 50 percent duty cycle. The maximum clock transition time (tTLHCL) requirement is considered met if proper
8/ VIL2 = 2.8 V at 25°C, 2.55 V at 125°C, 3.05 V at -55°C. output state changes occur with the rise time set to that given in the limits column.
9/ For input voltage conditions, see figure 10.
17/ The minimum clock pulse width (tp) requirement is considered met if
10/ For input voltage conditions, see figure 11. proper output state changes occur with the pulse width set to that given in
the limits column.
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