MIL-M-38510-51 Microcircuits, Digital, Cmos, Flip-Flops And Latchets, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-3851O/51F

NOTES:

1.   Test numbers 71 thru 74 (device type O1) and 55 thru 58 (device type 51) implemented by the following step by step sequence:

Monitor either Q or Q of the flip-flop under test.  Compliance with table III limits is established by a change of

logic levels at the Q or Q output in going from step 1 to step 2, step 2 to step 3, step 3 to step 4, step 6 to step

7, and step 7 to step 8, while no change shall occur in going from step 4 to step 5 or step 5 to step 6.

2.   Identical measurements are obtained from flip-flop number 1 and flip-flop number 2.

3.   VOH = 1 and VOL  = O.

4.   SW1 and SW3 are momentary contact switches.

FIGURE 5.  Clock input high and low test circuit for device types O1 and 51.

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