MIL-M-38510-51 Microcircuits, Digital, Cmos, Flip-Flops And Latchets, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/51F

NOTES:

1. To implement test numbers 63, 64, 65, and 66 (device type 01), and 47, 48, 49, and 50 (device type 51), place SW3 in the VIL1 position. Set the flip-flop by momentarily placing SW1 in position 2. Following the return of SW1 to position 1, momentarily place SW2 in position 2. Measure the output levels at Q and Q to insure compliance with table III limits.

2. To implement test numbers 67, 68, 69, and 70 (device type 01), and 51, 52, 53, and 54 (device type 51), set the flip-flop as described in note 1. Place SW3 in the VIH1 position. Momentarily place SW2 in position 2. Following the return of SW2 to position 1, measure the output level at Q and Q to insure compliance with table III limits.

3. Identical measurements are obtained from either flip-flop number 1 or flip-flop number 2.

4. SW1 and SW2 are momentary contact switches.

FIGURE 4. Data input high and low test circuit for device types 01 and 51.