MIL-M-38510-51 Microcircuits, Digital, Cmos, Flip-Flops And Latchets, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-3851O/51F

NOTES:'

1. Test numbers 67 thru 7O (device type O2) and 51 thru 54 (device type 52) are implemented by the following step by step sequence:

		SW1	SW2	SW3	Q	Q
		POS	POS	POS	OUT	OUT
STEP	1	2	1	-	"O"	"1"
	2	1	1	1	"1"	"O"
	3	1	2	1	"O"	"1"
	4	1	1	2	"O"	"1"
	5	1	2	2	"O"	"1"
	6	1	1	1	"1"	"O"
STEP	7	1	2	1	"O"	"1"

Monitor either Q or Q of the flip-flop under test. Compliance with table III limits is established by a change of logic levels at the Q or Q output in going from step 1 to step 2, step 2 to step 3, step 5 to step 6, and step 6

to step 7, while no change shall occur in going from step 3 to step 4 or step 4 to step 5.

2. Identical measurements are obtained from either flip-flop number 1 or flip-flop number 2.

3. VOH = "1" and VOL = "O".

4. SW1 and SW3 are momentary contact switches.

FIGURE 11. Clock input high and low test circuit for device types O2 and 52.