MIL-M-38510-51 Microcircuits, Digital, Cmos, Flip-Flops And Latchets, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/51F

NOTES:

1. To implement test numbers 59 thru 62 (device type 02) and 43 thru 46(device type 52), place SW3 in position 1. Set the flip-flop by momentarily placing SW1 in position 2. Following the return of SW1 to position 1, momentarily place SW2 in position 2. Measure the output levels at Q and Q to insure compliance with table III limits.

2. To implement test numbers 63 thru 66 (device type 02) and 47 thru 50 (device type 52), set the flip-flop as described in note 1. Place SW3 in position 2. Momentarily place SW2 in position 2. Following the return of SW2 to position 1, measure the output levels at Q and Q to insure compliance with table III limits.

3. Identical measurements are obtained from either flip-flop number 1 or flip-flop number 2.

4. SW1 and SW2 are momentary contact switches.

FIGURE 10. J and K input voltage high and low test circuit for device types 02 and 52.