MIL-M-38510-56 Microcircuits, Digital, Cmos, Counters/Dividers, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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11    Pins not designated may be high-level logic, low-level logic, or open.  Exceptions are as follows:

a.    VIC(POS) tests, the VSS  terminal shall be open. b.    VIC(NEG) tests, the VDD  terminal shall be open. c.    ISS tests, the output terminal shall be open.

21    The device manufacturer may, at his option, measure IIL  and IIH  at 25°C for each individual input or measure all inputs together.

31    See 4.4.1c for Ci  measurement.

41    Procedures for input1output tests of the device parameters specified below are described in figures 4, 5, 6, and 7.  Included with the specified parameters are test conditions and test limits at three temperatures.  These tests shall be performed at each specified VDD  voltage at the specified conditions.  VIL1VIH  test maybe performed as final attributes data.