MIL-M-38510/56G
3.3.1 Terminal connections. The terminal connections shall be as specified on figure 1.
3.3.2 Logic diagrams and functional waveforms. The logic diagrams and functional waveforms shall be as specified on figure 2.
3.3.3 Truth tables. The truth tables shall be as specified on figure 3.
3.3.4 Test procedures and test circuits. The test procedures and test circuits shall be as specified on figures 4 through 7.
3.3.5 Switching time waveforms and test circuit. The switching time waveforms and test circuit shall be as specified on figure 8.
3.3.6 Schematic circuits. The schematic circuits shall be maintained by the manufacturer and made available to the qualifying activity or preparing activity upon request.
3.3.7 Case outlines. The case outlines shall be as specified in 1.2.3.
3.4 Lead material and finish. The lead material and finish shall be in accordance with MIL-PRF-38535 (see 6.6).
3.5 Electrical performance characteristics. Unless otherwise specified, the electrical performance characteristics are as specified in table I, and apply over the full recommended case operating temperature range,.
3.6 Electrical test requirements. The electrical test requirements for each device class shall be the subgroups specified in table II. The electrical tests for each subgroup are described in table III.
3.7 Marking. Marking shall be in accordance with MIL-PRF-38535.
3.7.1 Radiation hardness assurance identifier. The radiation hardness assurance identifier shall be in accordance with MIL-PRF-38535 and 4.5.4 herein.
3.8 Microcircuit group assignment. The devices covered by this specification shall be in microcircuit group number 40 (see MIL-PRF-38535, appendix A).
4
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business