MIL-M-38510-56 Microcircuits, Digital, Cmos, Counters/Dividers, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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11    Unless otherwise specified, separately monitor or measure as required, each device terminal designated "OUT", "IOH", and "IOL" in the terminal condition columns of table III.  Values for "IOH" and "IOL" are specified in footnote 5.

21    Terminals designated "IN" indicate conditions and test methods are specified in footnote 5 and figures 4 through 8 or for "Ci" measurement, see 4.4.1c.

31    This ISS  and functional tests shall be performed in the test number sequence shown with no intervening changes to terminal conditions.  The functional test shall be performed with VIH  and VDD  ≤ 5.0 V and � 15.0 V.  Table III shows the lower of these two voltages.  During the

functional test, input terminals designated "PA", "PB", etc., shall have applied thereto a specified number of single pulses with the following parameters:

Pulse amplitude = VDD  maximum to VDD  = 4% minimum.  These pulses are enumerated as follows:

During the functional tests, device output voltages are:  don't care "X", high "H", or low "L" as specified in the terminal conditions columns.  The output voltage limits over the specified temperature range are "H" = VDD  -0.50 V minimum and "L" = VSS  +0.50 V maximum.

41    Undesignated terminal conditions indicate terminal may be high-level logic, low-level logic, or open except as follows:

VIC(POS)  tests, the VSS  terminals shall be open; VIC(NEG)  tests, the VDD  terminals shall be open; ISS  tests, the output terminals shall be open.

51    The following input voltages and output currents are terminal conditions for group A inspection:

61    The device manufacturer may, at his option, measure IIL  and IIH  at 25°C for each individual input or measure all inputs together.

71    Data pin need only be toggled high or low to allow outputs to achieve the proper setup state required to verify the indicated test parameter.