MIL-M-38510-56 Microcircuits, Digital, Cmos, Counters/Dividers, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, CMOS, logic microcircuits. Two product assurance classes and a choice of case outlines, lead finishes, and radiation hardness assurance RHA are provided and are reflected in the complete Part or Identifying Number PIN. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535 see 6.3.

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MIL-M-38510/56G

NOTES:

1.  Test conditions grouped by double horizontal lines are simultaneously applicable to the test being performed.

2.  Unless otherwise specified, test each output separately.

3.  "CL" conditions include probe and wiring capacitance.

4.  Apply input pulses as shown in abbreviated waveforms.  See figure 2 for complete functional waveforms.

5.  Setup times (tSHL and tSLH) are set to the maximum values given in the test limits columns of table III.

Setup time test requirements are considered met if counters advance in the next actuating transition of

the clock pulse following the negative transition of the reset, clock enable, or preset enable pulse.

Device type 02 "data" of the "data" input logic level with the next positive transition of the clock pulse after a "data" input logic change.

6.  For device type 02, the "Q5" output is connected to the "data" input in all switching time tests

except the "data" setup time test.

7.  The inputs marked with an asterisk designate the measured terminal.

8.  Duty cycle and PRR, although not relevant for real-time measurements, are specified to accommodate other measurement techniques.

FIGURE 8.  Switching time waveforms and test circuit - Continued.

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