MIL-M-38510/238B
APPENDIX A FUNCTIONAL ALGORITHMS
Functional algorithms are test patterns which define the exact sequence of tests used to verify proper operation of a random access memory (RAM). Each algorithm serves a specified purpose for the testing of the device.
A.1 FUNCTIONAL PATTERNS. A.1.1 Pattern 1.
CKBD.
a. Write a checkerboard pattern into memory (O in address O) from address O to N.
b. When the CS off test is performed, attempt to write the complement pattern into cell memory with the device not selected.
c. Read checkerboard pattern in the memory.
A.1.2 Pattern 2.
CKBD. Same as CKBD only with data complemented. A.1.3 Pattern 3.
MARCH.
a. Write test word into every location.
b. The addressing is then scanned from location "O" to location "N".
c. At each address, the test word is read and a complemented test word is written back into the same location. d. The addressing is then scanned in reverse from location "N" to location "O".
e. At each address, the complemented test word is read and the test word is written back in. A.1.4 Pattern 4.
GALPAT. This program will test all bits in the array. The addressing and interaction between bits for ac performance. The memory is initialized by writing a field of "1" and then a field of "0" into the cell memory.
a. Write a "1" in word location 0 (reference location). b. Word 0 is read.
c. Word 1 is read. d. Word 0 is read. e. Word 2 is read. f. Word 0 is read.
g. The reading procedure continues back and forth between word 0 and the next higher number word until word
4095(-1) or 1023(-2) is reached. Then increment to the next word which becomes the reference location and then step a through g again until all the words in the memory are used at least once as a reference.
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