MIL-M-38510-121 Microcircuits, Linear Monolithic And Multichip, Silicon 12 Bit Digital-To-Analog ConvertersThis specification covers the detail requirements for monolithic silicon, bipolar, interface, memory core drivers. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3

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Subgroup

Symbol

Test no.

Adapter pin numbers  1/

Energized relays

Measured pin

Equation   2/

Device

Types

Limits

Unit

4

6

7 thru 18

22 thru 37

No.

Value

Unit

Min

Max

4

TA  = 25°C

LE16

LE19

142

143

144

145

+15 V

"

" "

-15 V

"

" "

0000 0000 0001

0000 0000 0010

0000 0000 0100

0000 0000 1000

1111 1111 1110 1111

1111 1111 1101 1111

1111 1111 1011 1111

1111 1111 0111 1111

None

"

" "

21

"

" "

E139

E140

E141

E142

V

"

" "

03, 04

"

" "

-0.5

"

" "

0.5

"

" "

LSB

"

" "

LE20

LE23

146

147

148

149

"

" " "

"

" " "

0000 0001 0000

0000 0010 0000

0000 0100 0000

0000 1000 0000

1111 1110 1111 1111

1111 1101 1111 1111

1111 1011 1111 1111

1111 0111 1111 1111

"

" " "

"

" " "

E143

E144

E145

E146

"

" " "

S = ((E119  - E120)/4095)

"

" " "

"

" " "

"

" " "

"

" " "

LE24

LE25

150

151

"

"

" " " " " "

"

"

" " " " " "

A.  Record, (0000 BBBB BBBB), the sum of the codewords from tests 142 - 149 with positive linearity errors.

B.  Record, (0000 CCCC CCCC), the sum of the codewords from tests 142 - 149 with negative linearity errors.

"

"

"

"

"

"

"

"

Determine the sum of the recorded code-words obtained from tests 127 - 141 from tests 142 - 149 for positive errors.

Measure and calculate linearity error for the new DUT code-word (XXXX BBBB BBBB).  (See Table I, Note 9/)

"

" "

"

" "

"

" "

"

" "

XXXX BBBB BBBB XXXX BBBB BBBB 1111

None

21

E147

V

LE24  = 4.1(E120  + ((on-bits) x S) - E147)

Determine the sum of the recorded code-words obtained from tests 127 - 141 from tests 142 - 149 for negative errors. Measure and calculate linearity error for the new DUT code-word (yyyy CCCC CCCC).  (See Table I, Note 9/)

"

" "

"

"

"

"

"

"

yyyy CCCC CCCC yyyy CCCC CCCC 1111

None

21

E148

V

LE25  = 4.1(E120  + ((on-bits) x S) - E148)

MCE

152

153

154

155

156

157

158

159

160

161

162

163

"

"

" " " " " " " " " " " " " " " " " " " " " "

"

"

" " " " " " " " " " " " " " " " " " " " " "

0111 1111 1111

1000 0000 0000

0011 1111 1111

0100 0000 0000

0001 1111 1111

0010 0000 0000

0000 1111 1111

0001 0000 0000

0000 0111 1111

0000 1000 0000

0000 0011 1111

0000 0100 0000

0000 0001 1111

0000 0010 0000

0000 0000 1111

0000 0001 0000

0000 0000 0111

0000 0000 1000

0000 0000 0011

0000 0000 0100

0000 0000 0001

0000 0000 0010

0000 0000 0000

0000 0000 0001

1000 0000 0000 1111

0111 1111 1111 1111

1100 0000 0000 1111

1011 1111 1111 1111

1110 0000 0000 1111

1101 1111 1111 1111

1111 0000 0000 1111

1110 1111 1111 1111

1111 1000 0000 1111

1111 0111 1111 1111

1111 1100 0000 1111

1111 1011 1111 1111

1111 1110 0000 1111

1111 1101 1111 1111

1111 1111 0000 1111

1111 1110 1111 1111

1111 1111 1000 1111

1111 1111 0111 1111

1111 1111 1100 1111

1111 1111 1011 1111

1111 1111 1110 1111

1111 1111 1101 1111

1111 1111 1111 1111

1111 1111 1110 1111

None

"

" " " " " " " " " " " " " " " " " " " " " "

21

"

" " " " " " " " " " " " " " " " " " " " " "

E149

E150

E151

E152

E153

E154

E155

E156

E157

E158

E159

E160

E161

E162

E163

E164

E165

E166

E167

E168

E169

E170

E171

E172

V

"

" " " " " " " " " " " " " " " " " " " " " "

For each set of major carry codes N and N + 1

Calculate the associated error in LSB's as

Follows:

MCE = 4.1 (EA - EB)

where

EB = measured value from E149,E151,E153,etc. EA = measured value from E150,E152,E154,etc.

"

"

" " " " " " " " " " " " " " " " " " " " " "

-1.0

"

" " " " " " " " " " " " " " " " " " " " " "

1.0

"

" " " " " " " " " " " " " " " " " " " " " "

"

"

" " " " " " " " " " " " " " " " " " " " " "