TABLE III. Group A inspection for device types 03 and 04 - Continued.
Subgroup |
Symbol |
Test no. |
Adapter pin numbers 1/ |
Energized relays |
Measured pin |
Equation 2/ vREF = E64 IREF = 2 mA |
Oevice Types 03 |
Limits |
Unit |
||||||
4 |
6 |
7 thru 18 |
22 thru 37 |
No. |
value |
Unit |
Min |
Max |
|||||||
3 TA = -55°C |
vREF |
79 |
+15 v |
-15 v |
0000 0000 0000 |
1111 1111 1111 1111 |
None |
2 |
E64 |
v |
9.90 |
10.1 |
v |
||
IZS |
80 |
" |
" |
0000 0000 0000 |
1111 1111 1111 1111 |
K1 |
19 |
I29 |
IZS = (I29) (4096)/(I83 - I29) |
03, 04 |
-3 |
3 |
LSB |
||
AE |
81 |
" " |
" " |
1111 1111 1111 0000 0000 0000 |
0000 0000 0000 1111 1111 1111 1111 1111 |
" " |
21 " |
E65 E66 |
v " |
AE = 0.1 (E65 - E66) |
03 04 |
-0.44 -0.28 |
0.44 0.28 |
% |
|
BPOE |
82 |
" |
" |
0000 0000 0000 |
1111 1111 1111 1111 |
K2, K3 |
" |
E67 |
" |
BPOE = (-2.05) (E67) |
03 04 |
-17.6 -11.2 |
17.6 11.2 |
LSB |
|
BZE |
84 |
" |
" |
1000 0000 0000 |
0111 1111 1111 1111 |
K2 |
" |
E69 |
" |
BZE = (-2.05) (E69) |
" |
-9.2 |
9.2 |
LSB |
|
LE1 LE15 |
85 86 87 88 89 90 91 92 93 94 95 96 97 98 99 |
" " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " |
0001 0000 0000 0010 0000 0000 0011 0000 0000 0100 0000 0000 0101 0000 0000 0110 0000 0000 0111 0000 0000 1000 0000 0000 1001 0000 0000 1010 0000 0000 1011 0000 0000 1100 0000 0000 1101 0000 0000 1110 0000 0000 1111 0000 0000 |
1110 1111 1111 1111 1101 " 1100 " 1011 " 1010 " 1001 " 1000 " 0111 " 0110 " 0101 " 0100 " 0011 " 0010 " 0001 " 0000 " |
None " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " |
E70 E71 E72 E73 E74 E75 E76 E77 E78 E79 E80 E81 E82 E83 E84 |
" " " " " " " " " " " " " " " |
For each input code N calculate the Corresponding linearity error in LSB. LE = 4.1((E65-E66)(N/4095) + E66 -EA) where EA = measured value E70 through E92 N = OUT input digital code word in decimal form Thus for 12 bits N = (A1)(2 exp 11) + (A2) (2 exp 10 )+ … +(A12)(2 exp 0) A1, A2, A12 are 0 or 1. E65 and E66 correspond to the error amplifier Outputs at full scale and zero scale respectively. |
" " " " " " " " " " " " " " " " " |
-0.5 " " " " " " " " " " " " " " " " |
+0.5 " " " " " " " " " " " " " " " " |
" " " " " " " " " " " " " " " " " |
|
A. Record the OUT code-word, (XXXX 0000 0000), with the most positive error. 2/ B. Record the OUT code-word, (YYYY 0000 0000), with the most negative error. 2/ |
|||||||||||||||
LE16 LE19 |
100 101 102 103 |
+15 v " " " |
-15 v " " " |
0000 0000 0001 0000 0000 0010 0000 0000 0100 0000 0000 1000 |
1111 1111 1110 1111 1111 1111 1101 1111 1111 1111 1011 1111 1111 1111 0111 1111 |
None " " " |
21 " " " |
E85 E86 E87 E88 |
v " " " |
03, 04 " " " |
-0.5 " " " |
0.5 " " " |
LSB " " " |
||
LE20 LE23 |
104 105 106 107 |
" " " " |
" " " " |
0000 0001 0000 0000 0010 0000 0000 0100 0000 0000 1000 0000 |
1111 1110 1111 1111 1111 1101 1111 1111 1111 1011 1111 1111 1111 0111 1111 1111 |
" " " " |
" " " " |
E89 E90 E91 E92 |
" " " " |
S = ((E65 - E66)/4095) |
" " " " |
" " " " |
" " " " |
" " " " |
|
LE24 LE25 |
108 109 |
" " " " " " " " |
" " " " " " " " |
A. Record, (0000 BBBB BBBB), the sum of the codewords from tests 100 - 107 with positive linearity errors. B. Record, (0000 CCCC CCCC), the sum of the codewords from tests 100 - 107 with negative linearity errors. |
" " |
" " |
" " |
" " |
|||||||
Oetermine the sum of the recorded code-words obtained from tests 85 - 99 from tests 100 - 107 for positive errors. Measure and calculate linearity error for the new OUT code-word (XXXX BBBB BBBB). (See Table I, Note 9/) |
" " " |
" " " |
" " " |
" " " |
|||||||||||
XXXX BBBB BBBB XXXX BBBB BBBB 1111 |
None |
" |
E93 |
" |
LE24 = 4.1(E66 + ((on-bits) x S) - E93) |
||||||||||
Oetermine the sum of the recorded code-words obtained from tests 85 - 99 from tests 100 - 107 for negative errors. Measure and calculate linearity error for the new OUT code-word (YYYY CCCC CCCC). (See Table I, Note 9/) |
" " " |
" " |
" " |
" " |
|||||||||||
YYYY CCCC CCCC YYYY CCCC CCCC 1111 |
None |
" |
E94 |
" |
LE25 = 4.1(E66 + ((on-bits) x S) - E94) |
See footnotes at end of table.
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