MIL-M-38510-121 Microcircuits, Linear Monolithic And Multichip, Silicon 12 Bit Digital-To-Analog ConvertersThis specification covers the detail requirements for monolithic silicon, bipolar, interface, memory core drivers. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3

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MIL-M-38510/121A

TABLE I. Electrical performance characteristics - Continued.

Characteristics	Symbol	Conditions -55°C = TA = +125°C unless otherwise specified	Device type	Limits		Unit
				Min	Max
Reference input resistance	Ri	VREF = 10 V, TA = 25°C, See figure 5	01, 03, 04	15	25	kν
Output noise voltage	NO	VCC = 15 V, BW = 10 Hz to 100 kHz, TA = 25°C, See figure 6	01	----	60	∝Vrms
			02	----	100
			03	----	80
			04	----	60

1/ VCC = 5.0 V for device types 01 and 02 and 15 V for device type 03, VEE = -15.0 V, Vref = 10.000 V, Logic "0" = 0.8 V,

Logic "1" = 2.0 V, see figure 2 and table III.

2/ The output compliance voltage range (see 6.5) may vary for each vendor. Devices with a definite output resistance will draw additional current that is equal to the output compliance voltage divided by the device output resistance.

3/ See paragraph 6.5 for symbols and definitions.

4/ VCC not used for device 04.

5/ These parameters are to be tested in a power stable temperature condition (see MIL-STD-883 4.5.9.4). All other parameters will be tested using low duty cycle pulse testing (i.e., TA = TJ = TC (see MIL-STD-883, 4.5.9.1,

4.5.9.2, and 4.5.9.3)).

6/ The gain error of a 12 bit D/A converter in % corresponds to a zero scale to full-scale range error in LSB units. (i.e. ±0.2% X 4096 LSB/100% =8.2 LSB)

7/ BPOE is the error in the -10 V output voltage when the device is operated in the bipolar mode with all bits off.

8/ This test is performed in the unipolar mode over a 0 to 10 V range. The unipolar scale factor is 4096

LSB/10 V = 410 LSB/V. The bipolar factor is 4096 LSB/20 V = 205 LSB/ V.

9/ The manufacturer has the option of testing devices at all digital input codes or an abbreviated series of codes.

The abbreviated test should have a sufficient number of codes with or without limit guard banding such that an all codes test will not fail a device which passed the abbreviated test.