TABLE III. Group A inspection for device types 01 and 02 - Continued.
Subgroup Symbol Test no.
Adapter pin numbers 1/
4 6 7 thru 18 24 thru 35
Energized relays
Measured pin Figure Equation Oevice
Types
Limits
Min Max
Unit
No. |
Value |
Unit |
|||||||||||||||
4 |
5 V |
-15 V |
1111 1111 1111 |
0000 0000 0000 |
K1, K2 |
21 |
V149 |
V |
2 |
For each input code N, calculate the |
01, 02 |
-0.5 |
0.5 |
LSB |
|||
TA = 25°C |
" |
" |
0000 0000 0000 |
1111 1111 1111 |
" |
" |
V150 |
" |
" |
corresponding linearity error in LSB. |
" |
" |
" |
" |
|||
LE1 |
134 |
" |
" |
0000 0000 0001 |
1111 1111 1110 |
" |
" |
V151 |
" |
" |
" |
" |
" |
" |
|||
135 |
" |
" |
0000 0000 0010 |
1111 1111 1101 |
" |
" |
V152 |
" |
" |
" |
" |
" |
" |
||||
136 |
" |
" |
0000 0000 0100 |
1111 1111 1011 |
" |
" |
V153 |
" |
" |
LE = 410/G1L(VA-((V149-V150)/4095) N- V149) |
" |
" |
" |
" |
|||
137 |
" |
" |
0000 0000 1000 |
1111 1111 0111 |
" |
" |
V154 |
" |
" |
Where VA = measured value from V151 |
" |
" |
" |
" |
|||
138 |
" |
" |
0000 0001 0000 |
1111 1110 1111 |
" |
" |
V155 |
" |
" |
through V173 |
" |
" |
" |
" |
|||
139 |
" |
" |
0000 0010 0000 |
1111 1101 1111 |
" |
" |
V156 |
" |
" |
N = bit number (decimal) |
" |
" |
" |
" |
|||
140 |
" |
" |
0000 0100 0000 |
1111 1011 1111 |
" |
" |
V157 |
" |
" |
V149 VA V173 |
" |
" |
" |
" |
|||
LE8 |
141 |
" |
" |
0000 1000 0000 |
1111 0111 1111 |
" |
" |
V158 |
" |
" |
" |
" |
" |
" |
|||
A. Record, (0000 BBBB BBBB), the sum of the code-words from tests 134 - 141 with positive linearity errors.
B. Record, (0000 CCCC CCCC), the sum of the code-words from tests 134 - 141 with negative linearity errors.
LE9 |
142 |
5 V |
-15 V |
0001 0000 0000 |
1110 1111 1111 |
K1, K2 |
21 |
V159 |
V |
2 |
01, 02 |
-0.5 |
0.5 |
LSB |
|
143 |
" |
" |
0010 0000 0000 |
1101 1111 1111 |
" |
" |
V160 |
" |
" |
" |
" |
" |
" |
||
144 |
" |
" |
0011 0000 0000 |
1100 1111 1111 |
" |
" |
V161 |
" |
" |
" |
" |
" |
" |
||
145 |
" |
" |
0100 0000 0000 |
1011 1111 1111 |
" |
" |
V162 |
" |
" |
" |
" |
" |
" |
||
146 |
" |
" |
0101 0000 0000 |
1010 1111 1111 |
" |
" |
V163 |
" |
" |
" |
" |
" |
" |
||
147 |
" |
" |
0110 0000 0000 |
1001 1111 1111 |
" |
" |
V164 |
" |
" |
" |
" |
" |
" |
||
148 |
" |
" |
0111 0000 0000 |
1000 1111 1111 |
" |
" |
V165 |
" |
" |
| |
" |
" |
" |
" |
|
149 |
" |
" |
1000 0000 0000 |
0111 1111 1111 |
" |
" |
V166 |
" |
" |
S = ((V149-V150)/4095) |
" |
" |
" |
" |
|
150 |
" |
" |
1001 0000 0000 |
0110 1111 1111 |
" |
" |
V167 |
" |
" |
| |
" |
" |
" |
" |
|
151 |
" |
" |
1010 0000 0000 |
0101 1111 1111 |
" |
" |
V168 |
" |
" |
" |
" |
" |
" |
||
152 |
" |
" |
1011 0000 0000 |
0100 1111 1111 |
" |
" |
V169 |
" |
" |
" |
" |
" |
" |
||
153 |
" |
" |
1100 0000 0000 |
0011 1111 1111 |
" |
" |
V170 |
" |
" |
" |
" |
" |
" |
||
154 |
" |
" |
1101 0000 0000 |
0010 1111 1111 |
" |
" |
V171 |
" |
" |
" |
" |
" |
" |
||
155 |
" |
" |
1110 0000 0000 |
0001 1111 1111 |
" |
" |
V172 |
" |
" |
" |
" |
" |
" |
||
LE23 |
156 |
" |
" |
1111 0000 0000 |
0000 1111 1111 |
" |
" |
V173 |
" |
" |
" |
" |
" |
" |
A. Record the OUT code-word, (XXXX 0000 0000), with the most positive error.
B. Record the OUT code-word, (YYYY 0000 0000), with the most negative error.
Oetermine the sum of the recorded code-words obtained from tests 134 - 141 and from tests 142 - 156 for positive errors. Measure and calculate linearity error for the new OUT code-word (XXXX BBBB BBBB). (See Table I, note 9/).
LE24 157 5 V -15 V XXXX BBBB BBBB XXXX BBBB BBBB 1111
K1, K2 21 V174 V 2
LE24 = 410/G1(V174-((on-bits) xS) - V149)
01, 02 -0.5 0.5 LSB
Oetermine the sum of the recorded code-words obtained from tests 134 - 141 and from tests 142 - 156 for negative errors. Measure and calculate linearity error for the new OUT code-word (YYYY CCCC CCCC). (See Table I, note 9/).
LE25 158 5 V -15 V YYYY CCCC CCCC
YYYY CCCC CCCC 1111
K1, K2 21 V175 V 2
LE25 = 410/G1(V175-((on-bits) xS) - V149)
01, 02 -0.5 0.5 LSB
See footnotes at end of table.
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