MIL-M-38510/9E
TABLE I. Electrical performance characteristics - Continued.
Test |
Symbol |
Conditions -55qC ≤ TC ≤ +125qC unless otherwise specified |
Device type |
Limits |
||
Maximum clock frequency |
fMAX |
VCC = 5.0 V, CL = 50 pF ±10% RL = 400 n ±5% (See figure 9) |
06 |
24 |
MHz |
|
Propagation delay time, high to low level output from clear |
tPHL1 |
7 |
34 |
ns |
||
Propagation delay time, high to low level output from clock |
tPLH2 |
7 |
28 |
ns |
||
Propagation delay time, low to high level output from clock |
tPHL2 |
7 |
34 |
ns |
||
1/ Not more than one output should be shorted at a time.
2/ Device type:
01 - With the outputs open, mode control at 4.5 V, clock pulse applied to both clock inputs, ICC is measured immediately after the application of the clock pulse.
02 - With the outputs open, presets at 4.5 V, ICC is measured with the clock at ground and again with the clock at 4.5 V.
03 - ICC is measured with outputs open, serial inputs grounded, and a momentary ground, then 4.5 V
applied to clear.
04 - With the outputs open, serial at ground, clock, clock inhibit, and parallel inputs at 4.5 V, ICC is measured by applying momentary ground, then 4.5 V to shift load prior to measurement.
05 - With all outputs open, inputs A thru D grounded, 5.5. V applied to S0, S1, clear, and the serial inputs, ICC is tested by applying clock pulse.
06 - With the outputs open, clear at 5.5 V, shift load, J, K , and data inputs grounded, ICC is measured by applying clock pulse.
9
For Parts Inquires call Parts Hangar, Inc (727) 493-0744
© Copyright 2015 Integrated Publishing, Inc.
A Service Disabled Veteran Owned Small Business