MIL-M-38510-108 Microcircuits, Linear, Transistor Arrays, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon transistor arrays. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3

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MIL-M-38510/108A

4.4.3 Group C inspection. Group C inspection shall be in accordance with table IV of MIL-PRF-38535 and as follows:

a. End point electrical parameters shall be as specified in table II herein.

b. The steady-state life test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's QM plan in accordance with MIL-PRF-38535. The burn-in test circuit shall be maintained under document control by the device manufacturer's Technology Review Board (TRB) in accordance with MIL-PRF-38535 and shall be made available to the acquiring or preparing activity upon request. The test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in test method 1005 of MIL-STD-883.

c. Operating life test (method 1005 of MIL-STD-883) 1/.

Test condition	B		A 2/
Product assurance class	S	B	S	B
TA minimum	125°C	125°C	250°C	200°C
t minimum	1000 hours	1000 hours	100 hours or 200°C 1000 hours	100 hours
Sample size series number	5	5	10	10

Note:

1/ The vertical columns of this table establish alternate combinations of test conditions from which the manufacturer may choose any one for a given product class, at their option, unless otherwise specified in the procurement documentation.

2/ See 4.2b.

d. Steady state reverse bias (method 1005 of MIL-STD-883).

Test condition	A
Product assurance class	S
TA minimum	150°C
t minimum	72 hours
Sample size series number	5

4.4.4 Group D inspection. Group D inspection shall be in accordance with table V of MIL-PRF-38535. End point electrical parameters shall be as specified in table II herein.

4.5 Methods of inspection. Methods of inspection shall be specified as follows.

4.5.1 Voltage and current. All voltage values given are referenced to the microcircuit ground terminals. Currents given are conventional current and positive when flowing into the referenced terminal.