MIL-M-38510-108 Microcircuits, Linear, Transistor Arrays, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon transistor arrays. Two product assurance classes and a choice of case outlines and lead finishes are provided and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3

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MIL-M-38510/108A

TABLE I. Electrical performance characteristics - Continued.

Test	Symbol	Conditions	Temperature range	Device type	Limits 1/		Unit
					Min	Max
Fall time	tf	See figure 2	TA = +25°C	01, 02		80	ns
			TA = -55°C, +125°C			125
Channel separation	C.S.	See figure 3	TA = +25°C	01, 02	80		dB

1/ Limits apply to each transistor within the array, unless otherwise specified.

2/ Does not apply to Q5 of device type 02.

3/ Applies only to Darlington pair (Q3, Q4) of device type 01.

4/ Applies only to differential pair (Q1, Q2) of device type 02.

5/ Does not apply to Darlington pair (Q3, Q4) of device type 01.

6/ Does not apply to differential pair (Q1, Q2) of device type 02.

7/ Applies for pairs (Q1, Q2) of device type 01 and for pairs (Q1, Q3), (Q1, Q4), (Q1, Q5) of device type 02.

8/ (VBE @ 125°C - VBE @ 25°C)/(125°C - 25°C), (VBE @ 25°C - VBE @ -55°C)/(25°C - (-55°C))

9/ (ΙIVBEQA - VBEQBI @ 125°C - IVBEQA - VBEQBI @ 25°CΙ)/(125°C - 25°C), (ΙIVBEQA - VBEQBI @ 25°C - IVBEQA - VBEQBI @ -55°CΙ)/(25°C - (-55°C))

TABLE II. Electrical test requirements.

MIL-PRF-38535 test requirements	Subgroups (see table III)
MIL-PRF-38535 test requirements	Class S devices	Class B devices
Interim electrical parameters	1	1
Final electrical test parameters	1, (2, 3, 4)*	1, (2, 3, 4)*
Group A test requirements	1,2,3,4,5,6 7,9,10,11	1, 2, 3, 4
Group B electrical test parameters when using the method 5005 QCI option	1,2,3 and table IV delta limits	N/A
Group C end-point electrical parameters	1,2,3 and table IV delta limits	1,2,3 and table IV delta limits
Group D end-point electrical parameters	1,2,3	1,2,3

*PDA applies to subgroup 1

** VBE/T and (IVBEQA - VBEQBI)/T test as specified in table III herein for group A, subgroups 2 and 3, and ft tests as specified in table III herein for group A, subgroup 4, are not required for

final electrical tests (for device 02 only) but shall be performed for group A sample testing.

4. VERIFICATION.

4.1 Sampling and inspection. Sampling and inspection procedures shall be in accordance with MIL-PRF-38535 or as modified in the device manufacturer's Quality Management (QM) plan. The modification in the QM plan shall not effect the form, fit, or function as function as described herein.