MIL-M-38510-107 Microcircuits, Linear, Positive, Voltage Regulators, Monolithic SiliconThis specification covers the detail requirements for fixed output, monolithic silicon, positive voltage regulators. Two product assurance classes and a choice of case outlines and lead finish are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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MIL-M-38510/1070

TABLE III. Group A inspection for all device type 09 - Continued. 3/

Subgroup	Symbol	Test no.	Conditions see figure 5, unless otherwise specified		Limits		Unit	Notes
			Conditions see figure 5, unless otherwise specified		Min	Max
			Input voltage	Load current	Min	Max
4 TA = 25°C	VIN / VOUT	53	VIN = 30 V, ei = 1 V rms at f = 2,400 Hz	IL = -350 mA	50		dB	See 2/ figure 7
7 TA = 25°C	NO	54	VIN = 30 V	IL = -0.1 A		500	∝V rms	See 2/ figure 8
	VOUT / VIN	55	VIN = 30 V, VPULSE = 3.0 V	IL = -5 mA		30	mV/V	See figure 9
	VOUT / IL	56	VIN = 30 V	IL = -100 mA IL = -400 mA		2.5	mV/mA	See figure 10
	VOUT	57	VIN = 30 V	IL = -5 mA	22.80	25.20	V	See figure 5
8 TA = +125°C	VOUT	58	VIN = 30 V	IL = -5 mA			V	See figure 5
8 TA = +125°C	VOUT / T	59	VIN = 30 V	IL = -5 mA	-6.0	6.0	mV/°C	See figure 5, VOUT / T = (V57 - V58) x 10
8 TA = -55°C	VOUT	60	VIN = 30 V	IL = -5 mA			V	See figure 5
8 TA = -55°C	VOUT / T	61	VIN = 30 V	IL = -5 mA	-6.0	+6.0	mV/°C	See figure 5, VOUT / T = (V57 - V60) x 12.5

1/ One second maximum test duration.

2/ The meter for ei and eo shall have a minimum bandwidth from 10 Hz to 10 kHz and shall measure true rms voltages.

3/ For device types 02 through 09, all tests performed at TA = +125°C may, at the manufacturer's option, be performed at TA = +150°C. Specifications for TA = +125°C shall then apply at TA = +150°C.

4/ A 1 μF capacitor may be added to dampen oscillations during the IOS test for device types 02 through 09.

5/ The overload current test checks the device current limiting, and it is not a measure of the output peak current.