MIL-M-38510/107D
NOTES:
1. Output terminal must utilize a Kelvin connection.
2. IOS test duration: 1 second maximum.
S1: Position 2 for IOS test. Position 1 for all other tests.
3. The pulse generator has the following characteristics:
a. Pulse amplitude = -10 IL volts. b. Pulse width = 1.0 ms
c. Duty cycle = 2 percent (maximum).
Load current is determined by the voltage across the 1 ν resistor. Measurements shall be made 0.5 ms after the start of the pulse.
4. An alternate drive circuit for 2N6294 transistor may be used to develop the proper load current
through the 1 ν resistor.
5. Use position 2 of S2 for ISCD, ISCD tests only.
6. Thermal shutdown output voltage test is conducted without a heat sink at an ambient temperature of TA = +150°C.
7. VIN(LOW) and VIN(HIGH) per table III.
8. VRLINE = VB - VA.
9. The output voltage is sampled at the specified intervals. Strobe pulse with is 100 μs maximum.
10. I IL I minimum and I IL I maximum in accordance with table III
11. VRLOAD = VD - VC and VRLOAD = VE - VC.
12.
Device types |
02 |
03 |
04 |
05 |
06 |
07 |
08 |
09 |
RL |
1 kν |
2.4 kν |
3 kν |
4.8 k ν |
1 kν |
2.4 kν |
3 kν |
4.8 kν |
13. Alternate point for applying load circuit directly with automatic test equipment (place S3 in position 2).
14. A 1 μF capacitor may be added to dampen oscillations during the IOS test for device types 02 through 09.
FIGURE 5. Test circuit for static tests for device types 02, 03, 04, 05, 06, 07, 08, 09 - Continued.
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