MIL-M-38510-107 Microcircuits, Linear, Positive, Voltage Regulators, Monolithic SiliconThis specification covers the detail requirements for fixed output, monolithic silicon, positive voltage regulators. Two product assurance classes and a choice of case outlines and lead finish are provided for each type and are reflected in the complete part number. For this product, the requirements of MIL-M-38510 have been superseded by MIL-PRF-38535, see 6.3.

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MIL-M-38510/1070

TABLE I. Electrical performance characteristics for device type 09 - Continued. 4/

Test	Symbol	Conditions -55°C = TA = +125°C, see figure 5 and 3.5, unless otherwise specified			Limits		Unit
Test	Symbol	Input voltage	Load current	Other	Min	Max	Unit
Ripple rejection 3/	VIN / VOUT	VIN = 30 V, ei = 1 Vrms, at f = 2,400 Hz	IL = -350 mA	See figure 7, TA = 25°C	50		dB
Output noise 3/ voltage	NO	VIN = 30 V	IL = -0.1 A	See figure 8, TA = 25°C		500	∝Vrms
Line transient response	VOUT / VIN	VIN = 30 V, VPULSE = 3.0 V	IL = -5 mA	See figure 9, TA = 25°C		30	mV/V
Load transient response	VOUT / IL	VIN = 30 V	IL = -100 mA, IL = -400 mA	See figure 10, TA = 25°C		2.5	mV/mA
Average temperature coefficient of output voltage	VOUT / T	VIN = 30 V	IL = -5 mA	TA = +125°C and -55°C	-6.0	+6.0	mV/°C

1/ VOUT test at VIN = 8 V is conducted at TA = -55°C only.

2/ One second maximum test duration.

3/ The meter for ei and eo shall have a minimum bandwidth from 10 Hz to 10 kHz and shall measure true rms voltages.

4/ For device types 02 through 09, all tests performed at TA = +125°C may, at the manufacturer's option, be performed at TA = +150°C. Specifications for TA = +125°C shall then apply at TA = +150°C.

5/ A 1 μF capacitor may be added to dampen oscillations during the IOS test for device types 02 through 09.

6/ The overload current test checks the device current limiting, and it is not a measure of the output peak current.