TABLE III. Group A inspection for device type 01 - Continued.
Terminal conditions (pins not designated may be high > 2.0 V, low < 0.8 V, or open).
|
Subgroup |
Symbol |
MIL- STD-883 method |
Cases X, 2 11 |
2 |
3 |
4 |
6 |
8 |
9 |
10 |
12 |
13 |
14 |
16 |
18 |
19 |
20 |
Measured terminal |
Test limits |
Unit |
|
Cases A, B,C,D |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
|||||||
Test no. |
CLR 1 |
D1 |
CLK 1 |
PRE 1 |
Q1 |
Q1 |
GND |
Q2 |
Q2 |
PRE 2 |
CLK 2 |
D2 |
CLR 2 |
VCC |
Min |
Max |
|||||
9 TC = +25°C |
fMAX 71 fMAX 71 |
Fig. 5 Fig. 5 |
86 87 |
5.0 V |
E |
IN (D) |
5.0 V |
OUT |
GND " |
OUT |
5.0 V |
IN (D) |
E |
5.0 V |
5.0 V " |
1Q 2Q |
75 75 |
MHz 41 MHz 41 |
|||
tPLH1 |
Fig. 4 " " " |
88 89 90 91 |
IN (A) IN (B) |
GND GND |
IN (B) IN (A) |
OUT |
OUT |
" " " " |
OUT |
OUT |
IN (B) IN (A) |
GND GND |
IN (A) IN (B) |
" " " " |
CLR 1 to Q1 PRE 1 to Q1 CLR 2 to Q2 PRE 2 to Q2 |
2.0 " " " |
8.0 " " " |
ns " " " |
|||
tPLH2 |
Fig. 5 81 " " |
92 93 94 95 |
F 5.0 V |
IN (F) IN (E) |
IN (D) " |
5.0 V F |
OUT |
OUT |
" " " " |
OUT |
OUT |
5.0 V F |
IN (D) IN (D) |
IN (F) IN (E) |
F 5.0 V |
" " " " |
CLK 2 to Q2 CLK 2 to Q2 CLK 1 to Q1 CLK 1 to Q1 |
" " " " |
13.0 " " " |
" " " " |
|
tPHL2 |
" " " " |
96 97 98 99 |
5.0 V F |
IN (E) IN (F) |
" " |
F 5.0 V |
OUT |
OUT |
" " " " |
OUT |
OUT |
F 5.0 V |
IN (D) IN (D) |
IN (E) IN (F) |
5.0 V F |
" " " " |
CLK 1 to Q1 CLK 1 to Q1 CLK 2 to Q2 CLK 2 to Q2 |
" " " " |
11.5 " " " |
" " " " |
|
tPHL3 |
Fig. 4 Fig. 4 |
100 101 |
" " |
OUT |
OUT |
IN (B) IN (A) |
2.7 V 2.7 V |
IN (A) IN (B) |
" " |
CLR 2 to Q2 PRE 2 to Q2 |
" " |
16.0 16.0 |
" " |
||||||||
See footnotes at end of device type 01.
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