MIL-M-38510/502A APPENDIX A
GATE TEST PROGRAM AND FUNCTIONAL TESTS
A.1 SCOPE
A.1.1 This Appendix A covers the fuse test program to be used for unprogrammed devices, and defines the requirements for functional tests of unprogrammed devices. This Appendix is a mandatory part of this standard. The information contained herein is intended for compliance.
A.2 GATE TEST PROGRAM.
A.2.1 When required, as in paragraph 3.3.2.1, the device may be programmed as shown in table A-I. This program will allow for testing all of the available gates.
A.3 FUSE TESTS FOR DEVICE TYPES 01 AND 02.
A.3.1 Unprogrammed devices - Circuit A. A.3.1.1 Output polarity fuse check.
Terminal conditions: VCC = 8.5 V FE = 1.5 V CE = GND
All inputs = 3.0 V
a. Sense all outputs for logic low, any high is a failure. A.3.1.2 "AND" matrix fuse check.
Terminal condition: VCC = 4.5 V FE = 1.5 V CE = 10 V
All inputs = 10 V (except for input being checked)
a. Address all "P" terms with a binary count 0-47, put into F0 to F5 with F0 = LSB and F5 =MSB.
b. Sense output F7 for each "P" term. F7 should also be low and if it goes high, then it means a failure
since a fuse is open. The input being checked should be set first to VIH and then VIL. F7 should
remain low in both cases.
c. Repeat b for all inputs, one at a time.
d. Repeat a and then b for all "P" terms and their inputs. A.3.1.3 "OR" (Sum) matrix fuse check.
Terminal condition: VCC = 8.5 V FE = 1.5 V
I6 - I15 = Open
I0 - I15 = Binary Count Input for address
CE = GND
a. Sense each output for logic high. Any low is a failure, indicating a fuse open. b. Sense all output low when binary input count goes to 48. Any high is a failure.
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