TABLE 111. Group A inspection for device type 01 - Continued.
Subgroup |
Symbol |
M1L- STD- 883 method |
Case X |
1 |
2 |
3 |
4 |
5 |
6 |
7 |
8 |
9 |
10 |
11 |
12 |
13 |
14 |
15 |
16 |
17 |
18 |
19 |
20 |
21 |
22 |
23 |
24 |
25 |
26 |
27 |
28 |
Measured terminal |
Test limits |
Unit |
|
Test no. |
FE |
17 |
16 |
15 |
14 |
13 |
12 |
11 |
10 |
F7 |
F6 |
F5 |
F4 |
GND |
F3 |
F2 |
F1 |
F0 |
CE |
115 |
114 |
113 |
112 |
111 |
110 |
19 |
18 |
VCC |
Min |
Max |
|||||
1 TC=25°C |
1CEX |
60 61 62 63 64 65 66 67 |
5.5V |
5.5V |
5.5V |
5.5V |
GND " " " " " " " |
5.5V |
5.5V |
5.5V |
5.5V |
4.5V " " " " " " " |
5.5V " " " " " " " |
F0 F1 F2 F3 F4 F5 F6 F7 |
100 " " " " " " " |
µA " " " " " " " |
|||||||||||||||||||
1CC |
3005 |
68 |
GND |
GND |
GND |
GND |
GND |
GND |
GND |
GND |
" |
GND |
GND |
GND |
GND |
GND |
GND |
GND |
GND |
GND |
" |
VCC |
180 |
mA |
|||||||||||
2 |
Same tests and terminal conditions as in subgroup 1, except TC = 125°C. |
||||||||||||||||||||||||||||||||||
3 |
Same tests and terminal conditions as in subgroup 1, except TC = -55°C. |
||||||||||||||||||||||||||||||||||
7 TC=25°C |
Func- tional test |
69 |
1/ |
1/ |
1/ |
1/ |
1/ |
1/ |
1/ |
1/ |
1/ |
1/ |
1/ |
1/ |
GND |
1/ |
1/ |
1/ |
1/ |
GND |
1/ |
1/ |
1/ |
1/ |
1/ |
1/ |
1/ |
1/ |
1/ |
(8) Outputs |
1/ |
||||
8 |
Same tests and terminal conditions as in subgroup 7, except TC = -55°C. |
||||||||||||||||||||||||||||||||||
9 TC=25°C |
tPHL1 |
3003 Fig. 4 |
70 |
2/ |
2/ |
2/ |
2/ |
2/ |
2/ |
2/ |
2/ |
3/ |
3/ |
3/ |
3/ |
GND |
3/ |
3/ |
3/ |
3/ |
GND |
2/ |
2/ |
2/ |
2/ |
2/ |
2/ |
2/ |
2/ |
2/ |
(8) Outputs |
80 |
ns |
||
tPLH1 |
71 |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
80 |
" |
||||
tPHL2 |
72 |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
50 |
" |
||||
tPLH2 |
73 |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
" |
50 |
" |
||||
10 |
Same tests, terminal conditions and limits as subgroup 9, except TC = 125°C. |
||||||||||||||||||||||||||||||||||
11 |
Same tests, terminal conditions and limits as subgroup 9, except TC = -55°C. |
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1/ The functional tests shall verify that no fuses are blown for unprogrammed devices or that the altered item drawing pattern exists for programmed devices (see table 11). The functional tests shall be accomplished as defined in Appendix A for unprogrammed devices.
2/ (Programmed device) The test will check all inputs, gates, and outputs that have been programmed. Propagation test for tPHL1, tPLH1, tPHL2, tPLH2 is also measured. This test shall be performed with VCC = 4.5 V, and VCC = 5.5 V.
3/ The outputs are loaded per figure 4.
4/ For programmed devices, select an appropriate set of inputs to acquire the desired output state.
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