MIL-M-38510-502 Microcircuits, Digital, Bipolar Field Programmable Logic Array Fpla 16 X 48 X 8, Monolithic SiliconThis specification covers the detail requirements for monolithic silicon, bipolar, field programmable logic array FPLA microcircuits which employ thin film nichrome resistors WICr as the fusible link or programming element. Three product assurance classes and a choice of case outline/lead material and finish are provided for each type and are reflected in the complete part number.

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M1L-M-38510/502A

TABLE 11. Electrical test requirements.

M1L-PRF-38535 test requirements	Subgroups (per table 111) 2/, 3/
M1L-PRF-38535 test requirements	Class S devices	Class B devices
1nterim electrical parameters (pre burn-in)	1	1
Final electrical test parameters for unprogrammed devices	1, 2, 3, 7, 8	1, 2, 3, 7, 8
Final electrical test parameters for programmed devices	1, 2, 3, 7, 8, 9, 10, 11	1, 2, 3, 7, 8, 9
Group A test requirements	1, 2, 3, 7, 8, 9, 10, 11	1, 2, 3, 7, 8, 9, 10, 11
Group B electrical test parameters When using the method 5005 QC1 option	1, 2, 3, 7, 8, 9, 10, 11	N/A
Group C end-point electrical parameters	1, 2, 3, 7, 8, 9, 10, 11	1, 2, 3, 7, 8
Group D end-point electrical parameters	1, 2, 3, 7, 8	1, 2, 3, 7, 8

1/ (*) indicates PDA applies to subgroups 1 and 7.

2/ Any or all subgroups may be combined when using high-speed testers.

3/ Subgroup 7 and 8 shall consist of verifying the pattern specified.

F1GURE 1. Terminal connections.